2016
DOI: 10.1016/j.jallcom.2015.06.255
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Correlation between dislocation etch pits, carrier concentration and optical absorption in CdGeAs 2 grown by modified Vertical Bridgman method

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Cited by 7 publications
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“…Then, the AgGaGe n S 2(n+1) single crystals were grown by a modified Bridgman method. 34,35 Using powder XRD structure refinement, XPS, and Raman spectra, we have analyzed the crystal structure in detail, and characterized the electrical and optical properties of AgGaGe n S 2(n+1) single crystals. Finally, the asgrown crystals have undergone a thermal annealing treatment, so the detrimental absorptions have been eliminated and the band gap widened.…”
Section: Introductionmentioning
confidence: 99%
“…Then, the AgGaGe n S 2(n+1) single crystals were grown by a modified Bridgman method. 34,35 Using powder XRD structure refinement, XPS, and Raman spectra, we have analyzed the crystal structure in detail, and characterized the electrical and optical properties of AgGaGe n S 2(n+1) single crystals. Finally, the asgrown crystals have undergone a thermal annealing treatment, so the detrimental absorptions have been eliminated and the band gap widened.…”
Section: Introductionmentioning
confidence: 99%
“…The CdGeAs 2 crystal is a typical II-IV-V 2 ternary chalcopyrite semiconductor compound, which has a wide transparent range (2.3~18 µm) [1], the highest nonlinear optical coefficient (d 36 = 236 pm/V) [2], a large birefringence (n e − n o ≈ 0.09) [3], and high thermal conductivity (0.04 W/(cm•K)) [4]. Therefore, the CdGeAs 2 crystal can be widely used in the production of frequency-doubling and frequency-mixing infrared parametric oscillators [5].…”
Section: Introductionmentioning
confidence: 99%