2018
DOI: 10.1088/1674-1137/42/11/113104
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Corrections to R D and R D * in the BLMSSM

Abstract: 2) Xing-Xing Dong(þ¿¿) 3) Xi-Jie Zhan( ) Hai-Bin Zhang(

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Cited by 47 publications
(93 citation statements)
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“…The one-particle density matrix of a Kohn-Sham or generalized Kohn-Sham reference system of noninteracting Fermions is not treated as an approximation to the interacting system's density matrix, but as a rigorously defined quantity obeying its own set of exact conditions. While the present work approximates the Kohn-Sham density matrix using finite basis sets and approximate exchange-correlation functionals, evaluating the EDR from numerically exact Kohn-Sham density matrices [83,84] provides an interesting area for future work. Table 1.…”
Section: Methodsmentioning
confidence: 99%
“…The one-particle density matrix of a Kohn-Sham or generalized Kohn-Sham reference system of noninteracting Fermions is not treated as an approximation to the interacting system's density matrix, but as a rigorously defined quantity obeying its own set of exact conditions. While the present work approximates the Kohn-Sham density matrix using finite basis sets and approximate exchange-correlation functionals, evaluating the EDR from numerically exact Kohn-Sham density matrices [83,84] provides an interesting area for future work. Table 1.…”
Section: Methodsmentioning
confidence: 99%
“…Typically, a much larger bias voltage is needed to model the same current as measured in experiments. Methods such as including large alloy fluctuation in the simulation [25] have been proposed as remedies. However, the unrealistic turn-on voltage under normal conditions is an indication of missing critical transport physics in semiclassical models.…”
Section: Resultsmentioning
confidence: 99%
“…To estimate the gas concentration in the chamber, given volumes of air were injected through methylparaben powder contained in a 2 L glass bottle having a gas output connected to the measuring chamber. For long-term measurement under gas atmosphere, and to limit device degradation, the gate bias was modulated [37] using 1 s pulses at V G = -45 V separated by 9 s at V G = 0 V, the S-D bias was kept constant at V S-D = -30 V, the measurement time was set to 80 µs. For optical characterization, 4-tert-butylcalix [6]arene were spin-coated onto intrinsic silicon wafers with native oxide.…”
Section: Methodsmentioning
confidence: 99%