Corrections for matrix effects in X-ray fluorescence analysis—A tutorial

Rousseau, Richard M.

doi:10.1016/j.sab.2006.06.014

Cited by 106 publications

(64 citation statements)

References 17 publications

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“…in Table 1) shows that these relative errors are very similar and of the same order of magnitude. The fundamental parameter algorithm used by the Bruker proprietary software is thus valid, according to the test described by Rousseau (2006). In summary, the measurement reproducibility is controlled by both the intensity of the characteristic X-ray peak, which is a function of element concentration and the atomic number, and the ease of deconvoluting the characteristic X-ray peaks in the spectrum.…”

Section: Precisionmentioning

confidence: 99%

Application of benchtop micro-XRF to geological materials

2017

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Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20-30 μm on the sample, allowing major and trace element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based "standardless" quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument.Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate. Accuracy can be improved, however, by using a simple type-2 calibration against a reference material of similar matrix and composition.Qualitative analysis with micro-XRF can simplify and streamline sample characterisation and processing for subsequent geochemical and isotopic analysis.

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Section: Precisionmentioning

confidence: 99%

Application of benchtop micro-XRF to geological materials

2017

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“…They were reviewed and discussed in one chapter of "Handbook of X-Ray Spectrometry," edited by Van Grieken and Markowicz (de Vries and Vrebos, 2002) and numerous papers (Rousseau, 2001(Rousseau, , 2002(Rousseau, , 2004(Rousseau, , 2006, (Willis andLachance, 2000, 2004). The algorithms can be divided in different ways.…”

Section: Influence Coefficient Algorithmsmentioning

confidence: 99%

Quantification in X-Ray Fluorescence Spectrometry

Sitko¹,

Zawisza²

2012

X-Ray Spectroscopy

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“…Quantitative XRF analysis is complicated as the measured intensities are not only related to the analytes of interest but also depend on physical matrix effects including interferences, homogeneity of the samples, particle grain sizes, sample thickness, state of sample (solid, liquid, and semi-solid), and so on [26–29]. In addition, when there is excess of lighter elements in the samples, this leads to an effect called Compton scattering, which limits the accurate quantification due to the inelastic scattering of incident X-rays [26,28,30]. To eliminate the physical matrix effects and Compton effects, matrix matched standards are required.…”

Section: Resultsmentioning

confidence: 99%

“…There are several different factors such as absorption effects [26,27], enhancement effects [26,28], Compton normalization [26], matrix matching [27,28], grain size, and particle size influences [29], involved in the accurate quantification of results. These effects need to be considered in determining metal concentrations by XRF depending on the individual circumstance of the final sample of interest.…”

Section: Introductionmentioning

confidence: 99%

“…In this particular study, there is minimal or no Rayleigh scattering [30], the main effects that could contribute to the quantification include the physical matrix effects [31] and Compton effects [26]. To eliminate the physical matrix effects and Compton effects, one can use the matrix matched standards to develop calibration curves that in return can be used to generate the empirical influence coefficients which play a major role in the quantification studies [28]. The calibration studies must be performed in a similar matrix to that of the sample of interest.…”

Section: Introductionmentioning

confidence: 99%

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Portable X-ray fluorescence spectroscopy as a rapid screening technique for analysis of TiO2 and ZnO in sunscreens

Bairi

Lim

Quevedo

et al. 2016

Spectrochimica Acta Part B: Atomic Spectroscopy

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This investigation reports a rapid and simple screening technique for the quantification of titanium and zinc in commercial sunscreens using portable X-ray fluorescence spectroscopy (pXRF). A highly evolved technique, inductively coupled plasma-mass spectroscopy (ICP-MS) was chosen as a comparative technique to pXRF, and a good correlation (r2 > 0.995) with acceptable variations (≤25%) in results between both techniques was observed. Analytical figures of merit such as detection limit, quantitation limit, and linear range of the method are reported for the pXRF technique. This method has a good linearity (r2 > 0.995) for the analysis of titanium (Ti) in the range of 0.4–14.23 wt%, and zinc (Zn) in the range of 1.0–23.90 wt%. However, most commercial sunscreens contain organic ingredients, and these ingredients are known to cause matrix effects. The development of appropriate matrix matched working standards to obtain the calibration curve was found to be a major challenge for the pXRF measurements. In this study, we have overcome the matrix effect by using metal-free commercial sunscreens as a dispersing media for the preparation of working standards. An easy extension of this unique methodology for preparing working standards in different matrices was also reported. This method is simple, rapid, and cost-effective and, in comparison to conventional techniques (e.g., ICP-MS), did not generate toxic wastes during sample analysis.

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Corrections for matrix effects in X-ray fluorescence analysis—A tutorial

Cited by 106 publications

References 17 publications

Application of benchtop micro-XRF to geological materials

Application of benchtop micro-XRF to geological materials

Quantification in X-Ray Fluorescence Spectrometry

Portable X-ray fluorescence spectroscopy as a rapid screening technique for analysis of TiO2 and ZnO in sunscreens

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