Correction of Integrated X‐Ray Intensities for Preferred Orientation in Hexagonal Close‐Packed Powders Using Edxrd

Abstract

It is shown that energy-dispersive x-ray diffraction (EDXRD) method can be used for correction of integrated intensities for preferred orientation in hexagonal close-packed powders. The theory is based upon examination of the polar axis density distribution and upon the use of hexagonal harmonics in its representation. The reflexion method by Schulz added with defocusing correction was used. Measurements were carried out on three zinc samples with different degrees of orientation, the largest correction being 54 percent.

Defocusing in the Reflexion Technique for the Determination of Preferred Orientation Using EDXRD

“…So performing the defocusing correction improves the accuracy of the pole figure data, which is essential in deriving the properties of textured materials. The EDXRD method is suitable for the determination of the whole direct pole figures (Szpunar and Gerward, 1980) and for the study of the texture with the aid of polar axis density distributions (Laine et al, 1977;Kivila et al, 1980). The advantages of the EDXRD method compared with the conventional ADXRD method have been discussed previously elsewhere (Szpunar et al, 1974;Laine et al, 1977).…”

“…The use of the energy-dispersive X-ray diffraction (EDXRD) method for determination ofpreferred orientations and its adaptability to different texture studies have been demonstrated in several papers (Laine and Lahteemaki, 1971;Szpunar et al, 1974;de Ben and Broyde, 1973;Gerward et al, 1976;Heller et al, 1977;Laine et al, 1977;Gerward, 1978, 1980;Kivila et al, 1980). Many of these deal with the determination of inverse pole figures of the specimen by the Harris (1952) technique.…”

“…Many of these deal with the determination of inverse pole figures of the specimen by the Harris (1952) technique. Laine et al (1977), Gerward (1978, 1980) and Kivila et al (1980) have applied EDXRD to texture measurements using the Schulz reflexion technique (Schulz, 1949). Because in this reflexion technique the specimen is tilted about the axis located in the diffraction plane perpendicular to the goniometer axis, the correction has in most cases to be made for the occurrence of defocusing.…”

X-ray diffraction

“…Ton'shin and Spektor (406) describe a method for making cylindrical samples. Calvert and Sirianni (407) and Frevel (408) discuss a technique for controlling preferred orientation, and Plancon (409), Pesonen (410), and Kivila et al (411) discuss other aspects of the problem of preferred orientation. Harris and Cavin (412) discuss the interfering effects of epoxy in X-ray mounts.…”