2011
DOI: 10.1108/03056121111101287
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Correction of FPC solder position error based on mutual information entropy

Abstract: PurposeThe purpose of this paper is to study the application of advanced computer image processing techniques for solving the problem of solder position error correction for flexible printed circuit (FPC) solder.Design/methodology/approachTo correct position error, image information is defined according to information theory, and the mutual information entropy (MIE) is applied in evaluating the correlation between the images. A reference image is acquired which is used to evaluate the correlation with the insp… Show more

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Cited by 6 publications
(4 citation statements)
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“…Especially as the IC manufacturing process enters the 7-14 nm process, the FICS's line width and line distance also enter the process below 10 μm, this is also increasing the requirements for material properties and manufacturing processes. At present, the visual defect detection methods for Printed circuit board (PCB) or Flexible printed circuit board (FPC) [1,2] are mainly as follows: reference method [3], nonreference method [4,5] and hybrid method. These methods are difficult to meet the increasing detection speed and accuracy requirements of micro-nano-scale IC package inspection.…”
Section: Introductionmentioning
confidence: 99%
“…Especially as the IC manufacturing process enters the 7-14 nm process, the FICS's line width and line distance also enter the process below 10 μm, this is also increasing the requirements for material properties and manufacturing processes. At present, the visual defect detection methods for Printed circuit board (PCB) or Flexible printed circuit board (FPC) [1,2] are mainly as follows: reference method [3], nonreference method [4,5] and hybrid method. These methods are difficult to meet the increasing detection speed and accuracy requirements of micro-nano-scale IC package inspection.…”
Section: Introductionmentioning
confidence: 99%
“…It has been widely used in the semiconductor and electronics industries to detect defects such as copper oxidation, ink stains, etc. Currently, many visual defect detection methods for the IC substrates of printed circuit boards (PCBs) and flexible printed circuits (FPCs) have been studied [4][5][6]. These defect vision detection methods can mainly be divided into reference methods [7], nonreference methods [8,9] and mixed methods.…”
Section: Introductionmentioning
confidence: 99%
“…During the inspection process, false defects cannot be avoided because of the different acquisition times and the variations in lighting. Consequently, morphological operators, such as erosion, dilation and opening and closing, are applied to filter false defects and detect flaws on solder after subtraction (Chen et al , 2007; Wu et al , 2008; Zhao et al , 2009; Huang et al , 2011). The method, to some extent, relies on uniformity of lighting and platform motion accuracy to realize high quality inspection.…”
Section: Introductionmentioning
confidence: 99%