2012
DOI: 10.1002/xrs.2397
|View full text |Cite
|
Sign up to set email alerts
|

Correction for the effect of soil moisture on in situ XRF analysis using low‐energy background

Abstract: X-ray fluorescence (XRF) analyses are affected by many matrix and geometrical factors that, generally, are possible to handle in laboratory conditions. However, when in situ analyses are considered, constraints in the measurement conditions make more difficult to handle some factors, such as moisture, affecting the measurement accuracy. Efforts have been made to correct some of the effects by inserting some steps in the sample preparation process. The problem is that each step added in this process, aiming a b… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

4
37
0
2

Year Published

2017
2017
2022
2022

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 50 publications
(45 citation statements)
references
References 11 publications
4
37
0
2
Order By: Relevance
“…The authors suggest that some of the field‐based results should be checked against laboratory‐based reference methods to ensure reliability of results (Bartley et al, ). Another example was provided by Bastos, Melquiades, and Biasi (), who discussed the effect of moisture in the sample matrix on portable XRF results when analyzing soils.…”
Section: Dealing With Environmental Conditionsmentioning
confidence: 99%
“…The authors suggest that some of the field‐based results should be checked against laboratory‐based reference methods to ensure reliability of results (Bartley et al, ). Another example was provided by Bastos, Melquiades, and Biasi (), who discussed the effect of moisture in the sample matrix on portable XRF results when analyzing soils.…”
Section: Dealing With Environmental Conditionsmentioning
confidence: 99%
“…element being analyzed. Bastos, Melquiades and Biasi (2012) proposed a procedure for decreasing the moisture influence on soil analyses by pXRF. They utilized the background radiation as a parameter for low energies and concluded that, after this correction, the obtained results were satisfactory.…”
Section: How Can the Pxrf Equipment Be Used?mentioning
confidence: 99%
“…Technological advances enabled the emergence of portable equipment of X-ray fluorescence (pXRF), which has been showed to be a precise, accurate, low cost, rapid, non-destructive and environmentally friendly method to determine elemental composition of soils and other RIBEIRO, B. T. et al materials (Radu;Diamond, 2009;Zhang, 2011;Bastos;Melquiades;Biasi, 2012;Weindorf et al, 2012a;Weindorf et al, 2012bWeindorf et al, 2014aWeindorf et al, 2014b;Stockmann et al, 2016aStockmann et al, , 2016b.…”
Section: Introductionmentioning
confidence: 99%
“…However, since μ ‐XRF scanning spectroscopy involves the direct measurement of wet sediment surfaces, the resulting XRF intensity is affected by several interferences, such as the surface roughness (grain sizes), sample heterogeneity and interstitial pore water (Potts, ; Jansen et al ., ). In particular, the influence of pore water on μ ‐XRF scanning spectroscopy is significant, and calibration methods have been reported in several prior studies (Phedorin & Goldberg, ; Kido et al ., ; Tjallingii et al ., ; Weltje & Tjallingii, ; Bastos et al ., ; Hennekam & de Lange, ; Rowe et al ., ; Weindorf et al ., ; Boyle et al ., ; MacLachlan et al ., ; Weltje et al ., ; Chen et al ., ). Corrections of μ ‐XRF data for wet sediment have involved two steps: (i) estimation of the water content (WC) in the sediment based on direct and/or indirect parameters; (ii) correction for the effects of the WC on the XRF intensity.…”
Section: Introductionmentioning
confidence: 99%