2018
DOI: 10.3390/mi9090451
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Correction: Bernardin E.K.; et al. Demonstration of a Robust All-Silicon-Carbide Intracortical Neural Interface. Micromachines, 2018, 9, 412

Abstract: The authors would like to indicate the following financial support they received to the Acknowledgement Section of their published paper [...]

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Cited by 6 publications
(1 citation statement)
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“…The issues associated with overall mINP reliability have been attributed to a complex set of interactions involving both biotic and abiotic processes. For instance, the physiological neural environment, which possesses high concentrations of ionic and oxidative species, has been attributed to mINP device failure due to chemical interactions with the insulation material which manifests as physical swelling, cracking, film delamination, or physical corrosion [ 6 , 7 ]. Glial cell encapsulation due to the foreign body response results in isolation of the mINP from the neural environment, and has been attributed as a major aspect for device failure [ 8 ].…”
Section: Introductionmentioning
confidence: 99%
“…The issues associated with overall mINP reliability have been attributed to a complex set of interactions involving both biotic and abiotic processes. For instance, the physiological neural environment, which possesses high concentrations of ionic and oxidative species, has been attributed to mINP device failure due to chemical interactions with the insulation material which manifests as physical swelling, cracking, film delamination, or physical corrosion [ 6 , 7 ]. Glial cell encapsulation due to the foreign body response results in isolation of the mINP from the neural environment, and has been attributed as a major aspect for device failure [ 8 ].…”
Section: Introductionmentioning
confidence: 99%