Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging

Abstract

We report a software tool for post-correcting the linear and nonlinear image distortions of atomically resolved 3D spectrum imaging as well as 4D diffraction imaging. This tool improves the interpretability of distorted scanning transmission electron microscopy spectrum/diffraction imaging data.

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

“…Additionally, this paper also used simulations to determine that defocused-probe iterative ptychography outperformed both focused-probe iterative ptychography and the WDD reconstruction method by approximately a factor of 2 for signal-to-noise. Various authors have applied ptychography to solve materials science questions, including Yang et al (2015aYang et al ( , 2017, Wang et al (2017), dos Reis et al (2018), Lozano et al (2018), and Fang et al (2019).…”

“…The name “4D-STEM” is widely used in the literature, for example in Ophus et al (2014), Yang et al (2015 a ), Ryll et al (2016), Wang et al (2018), Fatermans et al (2018), Xu & LeBeau (2018), Hachtel et al (2018), and Mahr et al (2019), though this name is far from universal. Note that it has also been used in the past to refer to combination STEM electron energy loss spectroscopy (EELS) and tomography, which also produces a 4D dataset.…”

“…An example of virtual annular detectors is shown in Figure 2g, from an experiment by (Hachtel et al, 2018) imaging a DyScO3 sample at atomic resolution. Wang et al (2018) have proposed methods for correcting sample drift both in STEM-EELS and 4D-STEM experiments. Li et al (2019) have used machine learning methods to extract atomic-resolution defect information from 4D-STEM datasets.…”

Design of Complex Oxide Interfaces by Oxide Molecular Beam Epitaxy

“…A collection semi-angle of 111 mrad was used for EELS investigations [56]. For STEM data process and analyses, different software tools [120][121][122][123] have been used.…”

STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging

“…In this contribution, we report the development of a software tool [6], written in the Digital Micrograph (DM) scripting language, for post collection correction (off-the-fly) of image distortions in atomically resolved spectrum and diffractive imaging. It can be used to correct two typical image distortions, i.e., linear and nonlinear distortions, as shown in Fig.…”