“…The S 2s core-level spectrum Fig. 3(d) showed a peak located at 225.06 eV [29]. No obvious impurities could be detected in the sample, indicating that the level of impurities is lower than the resolution limit of XPS (1 at.%).…”
“…The S 2s core-level spectrum Fig. 3(d) showed a peak located at 225.06 eV [29]. No obvious impurities could be detected in the sample, indicating that the level of impurities is lower than the resolution limit of XPS (1 at.%).…”
“…Previously, a similar effect was observed for closely related compound LiGaS 2 . 49 Thus, the Li segregation to the crystal surface may be a general feature of compounds LiGaX 2 (X = S, Se, Te). The ratio Ga : Te = 0.55 is in reasonable consistence with nominal composition Ga : Te = 0.50.…”
Section: Resultsmentioning
confidence: 99%
“…Comparatively, the BE values obtained for Li 1s, Te 3d and Ga 2p core levels in LiGaTe 2 are in a good relation with the BE values obtained earlier in several other representative compounds. 49–52 …”
Section: Resultsmentioning
confidence: 99%
“…Comparatively, the BE values obtained for Li 1s, Te 3d and Ga 2p core levels in LiGaTe 2 are in a good relation with the BE values obtained earlier in several other representative compounds. [49][50][51][52] The calculated electronic total and partial densities of states (DOS and PDOS) projected on the constituent elements in LiGaTe 2 are displayed in Fig. 12.…”
Section: Comparison Between Xps Spectra and Band Structurementioning
The LiGaTe2 crystals were grown by the Bridgman–Stockbarger technique and the cell parameter dependence on temperature in the range of 303–563 K was evaluated by the X-ray diffraction analysis and first principles calculations.
“…It is well known that the chemical state of elements in the top surface layer with thickness $3-5 nm is controlled by XPS when Mg or Al Ka sources are used for X-ray illumination [15]. Previously, many nonlinear optical oxide and sulfide crystals were evaluated with XPS and detailed observation of electronic parameters and real chemical state of optical surface was obtained [16][17][18][19][20][21][22]. This information is valuable for optimization of optical surface preparation and cleaning.…”
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