Copper trace fatigue models for mechanical cycling, vibration and shock/drop of high-density PWAs

Farley, D.; Zhou, Yi; Askari, F.; Al-Bassyiouni, Moustafa; Dasgupta, Abhijit; Caers, J.F.J.M.; DeVries, Jack W.

doi:10.1016/j.microrel.2010.03.004

Cited by 9 publications

(4 citation statements)

References 5 publications

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“…The second remark concerns the values of the exponents of the power law function. Although the values are in line with other reported values of the fatigue exponent for Cu-structures, and in particular for such of comparable thickness where values of -0.14 to -0.46 could be evaluated [21], one must be cautious as to the precise value of the exponents in view of the above mentioned effect of stress concentration. Below it will be demonstrated what the consequences are for the analyses of the test data.…”

Section: Lifetime Modeling For Stretchable Technologysupporting

confidence: 89%

Lifetime aspects of wearable electronics

Vries

2014

FACTA U EE

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In the course of two European projects the endurance behavior of stretchable electronic substrates and of electronic textiles was investigated. The results have to a large extent been published already. In this work new analyses to the earlier results are presented. Straightforward analytical approaches are used to describe fatigue under cyclic mechanical loading in the two technologies. For stretchable substrates the actual plastic strain upon stretching could be qualitatively evaluated to replace the engineering strain. For the textile-based substrates the bending strain was estimated. Additionally, there are sub-categories within each technology which perform differently and apparently show percolation behavior.

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Section: Lifetime Modeling For Stretchable Technologysupporting

confidence: 89%

Lifetime aspects of wearable electronics

Vries

2014

FACTA U EE

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“…These are single-sided PWAs with daisy-chained LGA components grouped into 4 columns of 3 components each. The details can be found in [13]. Non-functional daisy-chained components are used, with corresponding daisy chains in the PWA, to facilitate electrical failure monitoring.…”

Section: Specimen and Test Methodologymentioning

confidence: 99%

“…Studies show that redesigned Cu traces can indeed survive repetitive mechanical loading and that the failure site shifts elsewhere [9,11,13].…”

Section: Literature Reviewmentioning

confidence: 99%