2023
DOI: 10.1109/tasc.2023.3249127
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Copper Encapsulated Ultra-Thin NbN Films and Damascene Structures on 300 mm Si Wafers

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“…In this process, the assumption is that the minimum diameter of the JJs is assumed to be 200 nm, and the minimum feature size for the lines is 100 nm. The line thickness is 100 nm, which is possible in [34].…”
mentioning
confidence: 99%
“…In this process, the assumption is that the minimum diameter of the JJs is assumed to be 200 nm, and the minimum feature size for the lines is 100 nm. The line thickness is 100 nm, which is possible in [34].…”
mentioning
confidence: 99%