2013
DOI: 10.1111/jace.12513
|View full text |Cite
|
Sign up to set email alerts
|

Conversion of Solution‐Derived Perhydropolysilazane Thin Films into Silica in Basic Humid Atmosphere at Room Temperature

Abstract: Spin‐on perhydropolysilazane (PHPS) thin films were converted into mechanically hard silica thin films by an exposure to the vapor from aqueous ammonia. Infrared absorption and X‐ray photoelectron spectroscopic analyses were conducted to clarify the details of the PHPS‐to‐silica conversion and the nature of the silica thin film products. The PHPS‐to‐silica conversion was found to proceed rapidly between 2 and 3 h of exposure via a reaction‐limited process, where the refractive index and the pencil hardness gre… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

2
28
0
2

Year Published

2015
2015
2023
2023

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 31 publications
(32 citation statements)
references
References 44 publications
2
28
0
2
Order By: Relevance
“…The layer thickness of all films was approximately 500 nm (uncured) with only minor changes after the conversion. The decrease of the refractive indices determined by ellipsometry with approximately 1.56 for PHPS as deposited, 1.51 after one VUV scan and 1.47 for SiO x after the second and third VUV scans is in agreement with values of the literature [21]. After a first VUV-run absorption bands of SiH, NH and SiNSi still appear.…”
Section: First Trials and Optical Propertiessupporting
confidence: 90%
See 2 more Smart Citations
“…The layer thickness of all films was approximately 500 nm (uncured) with only minor changes after the conversion. The decrease of the refractive indices determined by ellipsometry with approximately 1.56 for PHPS as deposited, 1.51 after one VUV scan and 1.47 for SiO x after the second and third VUV scans is in agreement with values of the literature [21]. After a first VUV-run absorption bands of SiH, NH and SiNSi still appear.…”
Section: First Trials and Optical Propertiessupporting
confidence: 90%
“…This will be part of the ongoing research. The mechanical proof and the potential of the SiO x -layers are already described in literature [13,15,21,25,32] .…”
Section: R2r-coating: the Variation Of The Substrates And Vuv Investimentioning
confidence: 99%
See 1 more Smart Citation
“…The absorption bands located at 3380 cm −1 and 1176 cm −1 correspond to the stretching vibration and bending vibration of the NH bond, respectively, while the absorption band at 2160 cm −1 is due to the stretching vibration of the SiH bond. The broad absorption band between 820 cm −1 and 1020 cm −1 is attributed to overlap of the vibrations of the SiNSi bond …”
Section: Resultsmentioning
confidence: 99%
“…To measure the degree of PHPS-to-silica conversion, the atomic contents of the obtained film were provided in Fig. S1, where the O/Si mole ratio of 1.97 indicates the high efficiency of this conversion method [38]. Crystallization state of silica has strong influence on the dielectric properties.…”
mentioning
confidence: 99%