2017
DOI: 10.1039/c7tb01925d
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Controlling wettability of PECVD-deposited dual organosilicon/carboxylic acid films to influence DNA hybridisation assay efficiency

Abstract: Plasma oxidation of Zeonor and deposition of TEOS/AA thin film showing dual layer effect on the surface.

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Cited by 3 publications
(2 citation statements)
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“…Samples were placed in the diffusion region of the plasma 150 mm from the electrode base. XPS analysis was carried out using a VG Microtech electron spectrometer at a base pressure of 5×10 −10 mbar, following the methods described in our previous work [37]. Film thickness calculations in the XPS were performed using the NIST EAL database programme version 1.3.…”
Section: Instrumentationmentioning
confidence: 99%
“…Samples were placed in the diffusion region of the plasma 150 mm from the electrode base. XPS analysis was carried out using a VG Microtech electron spectrometer at a base pressure of 5×10 −10 mbar, following the methods described in our previous work [37]. Film thickness calculations in the XPS were performed using the NIST EAL database programme version 1.3.…”
Section: Instrumentationmentioning
confidence: 99%
“…There are many factors that affect hybridization such as surface coverage, , surface topography and chemistry, ,, target concentration, , solvent status, , , spacer, backfiller, strand length, ,,, and DNA sequence. ,, Typically, the surface coverage plays a significant role in hybridization processes. It refers to the number of probe molecules immobilized on the microarray surface, which could directly impact the efficiency of the target-probe hybridization.…”
Section: Introductionmentioning
confidence: 99%