2019
DOI: 10.1021/acsami.9b20514
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Controlling the Nature of Etched Si Nanostructures: High- versus Low-Load Metal-Assisted Catalytic Etching (MACE) of Si Powders

Abstract: Metal-assisted catalytic etching (MACE) involving Ag deposited on Si particles has been reported as a facile method for the production of Si nanowires (Si NWs). We show that the structure of Si particles subjected to MACE changes dramatically in response to changing the loading of the Ag catalyst. The

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Cited by 12 publications
(36 citation statements)
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“…The idea that band bending and charge imbalance on the metal nanoparticle polarizes the surrounding Si to engender local electropolishing beneath the metal nanoparticle and remote porosification away from the metal nanoparticle was first proposed and supported by band bending calculations by Kolasinski in 2014 [90], then confirmed through quantitative two-dimensional band bending modelling by Torralba et al in 2016 [35], and confirmed again by Wang et al in 2018 [62]. Tamarov et al [63] expanded these concepts by interpretation of extensive experimental data through theoretical calculations for a full range of heavily, moderately and lightly doped p and n type Si in combination with Cu, Ag, Au, Pd and Pt catalysts.…”
Section: Figurementioning
confidence: 93%
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“…The idea that band bending and charge imbalance on the metal nanoparticle polarizes the surrounding Si to engender local electropolishing beneath the metal nanoparticle and remote porosification away from the metal nanoparticle was first proposed and supported by band bending calculations by Kolasinski in 2014 [90], then confirmed through quantitative two-dimensional band bending modelling by Torralba et al in 2016 [35], and confirmed again by Wang et al in 2018 [62]. Tamarov et al [63] expanded these concepts by interpretation of extensive experimental data through theoretical calculations for a full range of heavily, moderately and lightly doped p and n type Si in combination with Cu, Ag, Au, Pd and Pt catalysts.…”
Section: Figurementioning
confidence: 93%
“…When etching is extensive enough to generate an easily weighable mass difference, then reactant depletion must be taken into consideration. Two other factors, discussed further by Tamarov et al [63], that complicate quantitative analysis are that etching and Si mass loss occur during metal deposition and the presence of side reactions of the oxidant. It should also be noted that when pores become long, transport constraints will hinder uniform mixing as is required for simple application of a rate law.…”
Section: Methodsmentioning
confidence: 99%
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