2011
DOI: 10.1016/j.jcrysgro.2010.10.107
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Controlled growth of exciton–polariton microcavities using in situ spectral reflectivity measurements

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Cited by 9 publications
(6 citation statements)
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References 16 publications
(21 reference statements)
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“…Although the performance data are shown for a FP laser, which usually emits in a multi-mode regime, we have demonstrated that similar single-mode cw output-power levels can be obtained for SP QCLs in combination with a lateral DFB grating of first order [23]. We attribute the slightly improved performance of the employed active region design with respect to our previously reported results [20] to a combination of improved growth conditions, such as in-situ growth rate control [24], and a slightly increased Al content in the barriers.…”
Section: Resultssupporting
confidence: 65%
“…Although the performance data are shown for a FP laser, which usually emits in a multi-mode regime, we have demonstrated that similar single-mode cw output-power levels can be obtained for SP QCLs in combination with a lateral DFB grating of first order [23]. We attribute the slightly improved performance of the employed active region design with respect to our previously reported results [20] to a combination of improved growth conditions, such as in-situ growth rate control [24], and a slightly increased Al content in the barriers.…”
Section: Resultssupporting
confidence: 65%
“…A detailed description of the growth procedure can be found in Ref. [15]. Figure 1 shows microreflectance (μ-R) spectra of the MC measured at different positions along the straight line on the sample surface shown in Fig.…”
Section: Experimental Setup and Sample Descriptionmentioning
confidence: 99%
“…In such cases, all λ/4 layers of thick mirror layers were grown as short‐period‐super‐lattices (SPSLs), as it has been shown that the numerous interfaces of SPSLs hinders the propagation of misfit dislocation through the epilayers (). The matching of microcavity resonance wavelength and QW emission wavelength was ensured by applying in situ continuous spectral reflectivity measurements ().…”
Section: Epitaxial Growth Of Gaas(110) and Gaas(111)b Quantum Wellsmentioning
confidence: 99%