2009
DOI: 10.1016/j.vacuum.2008.10.003
|View full text |Cite
|
Sign up to set email alerts
|

Controlled growth and characteristics of single-phase Cu2O and CuO films by pulsed laser deposition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

9
90
1
7

Year Published

2010
2010
2018
2018

Publication Types

Select...
7
1
1

Relationship

0
9

Authors

Journals

citations
Cited by 249 publications
(118 citation statements)
references
References 20 publications
9
90
1
7
Order By: Relevance
“…The peak position of the Cu 2p 3/2 level is identical to the reported values, which were observed for Cu 2 O thin ilms prepared by other methods [31,33]. In addition, no peak for the CuO phase was observed at its typical value of 944 eV [31].…”
Section: Modern Technologies For Creating the Thin-film Systems And Csupporting
confidence: 86%
See 1 more Smart Citation
“…The peak position of the Cu 2p 3/2 level is identical to the reported values, which were observed for Cu 2 O thin ilms prepared by other methods [31,33]. In addition, no peak for the CuO phase was observed at its typical value of 944 eV [31].…”
Section: Modern Technologies For Creating the Thin-film Systems And Csupporting
confidence: 86%
“…In addition, most of the aforementioned physical processing techniques are not economically viable in large area applications. Solution-based processes have, therefore, emerged as atractive alternatives because of the ability for cost-efective production [31]. Armelao and coworkers have successfully employed a sol-gel solution containing dissolved copper acetate to produce a Cu 2 O thin ilm [32].…”
Section: Molecular Precursor Methodsmentioning
confidence: 99%
“…The band gap values obtained are in the range 2.43 eV to 2.5 eV (Table I) and are in close agreement with the values reported in the literature. 32,33 The size dependent band gap is a quantum confinement effect and the observation of this effect for grains of nanostructutred films of Cu 2 O of size much larger than the Bohr exciton diameter of the material indicates the existence of a potential barrier inside the grains restraining the movement of the charge carriers as Noack and Eychmuller 34 explained the blue shift of band gap in the case of ZnO thin films consisting of nanoparticles of size larger than Bohr exciton diameter. Figure 6 shows the photoluminescence (PL) spectra of nanostructured Cu 2 O films obtained by oxidizing the nanostructured Cu films deposited by evaporating different masses of Cu at a pressure of 1 × 10 −4 mbar and recorded with an excitation wavelength of 310 nm.…”
Section: Resultsmentioning
confidence: 99%
“…A wide range of deposition techniques such as chemical vapor deposition, 13 electrodeposition, 14 thermal evaporation, 15 sol-gel techniques, 16 spray pyrolysis, 17 pulsed laser deposition, 18 and plasma based ion implantation and deposition 19 have been used to prepare metal oxide films including Cu oxide films. The physical and chemical properties of the films are affected by the deposition method and its conditions.…”
mentioning
confidence: 99%