2008
DOI: 10.1002/adfm.200700766
|View full text |Cite
|
Sign up to set email alerts
|

Control of the Surface Composition of a Conducting‐Polymer Complex Film to Tune the Work Function

Abstract: Control of surface composition of a hole‐injecting conducting polymer complex, poly(3,4‐ethylenedioxy thiophene) (PEDOT) doped with a polystyrene sulfonate (PSS) has been conducted in the spin‐cast films. We found that the work function of the polymeric complex films formed via single spin‐coating can be greatly increased up to 5.44 eV by increasing the surface concentration of the PSS dopant. As a result, we improved the device efficiency and the lifetime of green emitting polymer light‐emitting diodes (PLEDs… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

12
168
1
1

Year Published

2009
2009
2022
2022

Publication Types

Select...
7
2

Relationship

0
9

Authors

Journals

citations
Cited by 150 publications
(184 citation statements)
references
References 24 publications
12
168
1
1
Order By: Relevance
“…Pure PEDOT:PSS is known to form a capping layer of PSS on top of the fi lm [ 17 ] which, however, is removed by the EG post-treatment. [ 16 ] Since our multilayer samples are EG posttreated before applying additional layers, the PSS layer is removed from the surface prior to the following coating cycle.…”
Section: Sheet Resistancementioning
confidence: 99%
“…Pure PEDOT:PSS is known to form a capping layer of PSS on top of the fi lm [ 17 ] which, however, is removed by the EG post-treatment. [ 16 ] Since our multilayer samples are EG posttreated before applying additional layers, the PSS layer is removed from the surface prior to the following coating cycle.…”
Section: Sheet Resistancementioning
confidence: 99%
“…However, this statement requires further experimental and theoretical attention, and alternative explanations can be found in the recent literature. [25] We are currently investigating this in more detail and will report on the matter in due course.…”
mentioning
confidence: 97%
“…This corresponds to decreases of 12% and 40% in the PSS component of the near-surface region for PEDOT:PSS ADD and PEDOT:PSS IMM electrodes respectively. The information depth was estimated to be $8 nm, given the inelastic mean free path of 27 Å for S 2p electrons through the material, and the 90 degree take-off angle (with respect to the surface plane) employed in this work [33]. This complements the UV-Vis spectra (inset Fig.…”
Section: Resultsmentioning
confidence: 55%