1996
DOI: 10.1057/palgrave.jors.0470109
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Control Limits for Multi-stage Manufacturing Processes with Binomial Yield (Single and Multiple Production Runs)

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Cited by 6 publications
(8 citation statements)
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“…Given two condition categories for remanufacturable items, in which each item has a probability α of being low cost (independent of the others), the number of low‐cost items in an acquired batch is binomially distributed. In a traditional manufacturing setting, the binomial distribution is appropriate in situations where the production of any individual item is independent of all other items (Barad and Braha 1996, Grosfeld‐Nir and Gerchak 2004, Yano and Lee 1995). This is also the case in remanufacturing, since remanufactured items are collected in lots that typically have little relationship to their original manufacturing sequence.…”
Section: A Discrete Condition Modelmentioning
confidence: 99%
“…Given two condition categories for remanufacturable items, in which each item has a probability α of being low cost (independent of the others), the number of low‐cost items in an acquired batch is binomially distributed. In a traditional manufacturing setting, the binomial distribution is appropriate in situations where the production of any individual item is independent of all other items (Barad and Braha 1996, Grosfeld‐Nir and Gerchak 2004, Yano and Lee 1995). This is also the case in remanufacturing, since remanufactured items are collected in lots that typically have little relationship to their original manufacturing sequence.…”
Section: A Discrete Condition Modelmentioning
confidence: 99%
“…In Barad and Braha (1996) and Emmons and Rabinowitz (2002) it is assumed that an inspection is made at each production stage, so there is no problem of allocating (a limited number of) inspection facilities to production stations. The former address the problem of finding the optimal (limits for the) input quantity in each stage, while the latter focus on the assignment and scheduling of inspection tasks.…”
Section: Joint Optimizationmentioning
confidence: 99%
“…The model of Barad and Braha (1996) (also set in the microelectronics industry) is essentially an optimal lot sizing problem in a MSPS with binomial yield and deterministic demand. After each production stage, a 100% reliable inspection is performed, so that all defective units are discarded.…”
Section: Joint Optimizationmentioning
confidence: 99%
“…Mazzola et al [11] provides the earliest work on an inventory model with binomial yield. For other works in this category, see Beja [3], Grosfeld-Nir and Gerchak [8], Barad and Braha [2], Sepheri et al [14], and Gürbüz [10].…”
Section: Introductionmentioning
confidence: 99%