Contribution to the percolation threshold study of Silicon carbide filled polydimethylsiloxane composites used for field grading application
Renaud Metz,
Sofiane Terzi,
Barbara Fayard
et al.
Abstract:The correlations between the electrical behavior and microstructural properties of samples consisting of particle composites fabricated from SiC particles embedded in a silicone matrix, were investigated using X-ray computed tomography. In the voltage field range 200-1000 V/mm, the measured conductivity as a function of SiC volume fraction exhibits two distinct gaps. Upon further investigations, we attribute these observations to percolation thresholds at the microscale. The first gap, corresponding to interco… Show more
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