2020
DOI: 10.3390/nano10112240
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Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A Review

Abstract: Quantum dots are under intense research, given their amazing properties which favor their use in electronics, optoelectronics, energy, medicine and other important applications. For many of these technological applications, quantum dots are used in their ordered self-assembled form, called superlattice. Understanding the mechanism of formation of the superlattices is crucial to designing quantum dots devices with desired properties. Here we review some of the most important findings about the formation of such… Show more

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Cited by 9 publications
(9 citation statements)
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“…The origin of a certain superlattice configuration for the case of PbS NCs is still a subject of ongoing research because, even at seemingly similar conditions, different self-assembled superlattice structures have been observed. , The recently emerged in situ X-ray scattering methods of the self-assembly characterization represent a promising route for providing insights into the assembly mechanism and uncover the time-resolved superlattice transitions. However, the discussion and determination of the ligand grafting density are often absent in the literature, which complicates comparison between experimental results obtained for similar systems in independent investigations and hinder the development of theoretical models that would help to navigate the assembly pathway to produce the targeted superlattices.…”
Section: Introductionmentioning
confidence: 99%
“…The origin of a certain superlattice configuration for the case of PbS NCs is still a subject of ongoing research because, even at seemingly similar conditions, different self-assembled superlattice structures have been observed. , The recently emerged in situ X-ray scattering methods of the self-assembly characterization represent a promising route for providing insights into the assembly mechanism and uncover the time-resolved superlattice transitions. However, the discussion and determination of the ligand grafting density are often absent in the literature, which complicates comparison between experimental results obtained for similar systems in independent investigations and hinder the development of theoretical models that would help to navigate the assembly pathway to produce the targeted superlattices.…”
Section: Introductionmentioning
confidence: 99%
“…X-ray diffraction (XRD) is one of the most widespread approaches to the characterization of nanomaterials. Specifically, small- and wide-angle X-ray scattering (especially grazing-incidence techniques) are used to study the structure of colloidal nanocrystal superlattices and assemblies. Experiments with these techniques are performed with dedicated benchtop instruments or at specific synchrotron beamlines, and hence they are bound to instrumental accessibility.…”
mentioning
confidence: 99%
“…In this way, the penetration depth of X‐rays can be tuned, typically from below 1 nm up to several 100 nm and thus the surface‐sensitivity can be adjusted. [ 233,234 ]…”
Section: X‐ray Scattering Methodsmentioning
confidence: 99%
“…Here, GISAXS is the method of choice, providing structural information at and close to the interface with high spatial resolution normal to the interface. A recent review focuses particularly on quantum dot self‐assembly probed by GISAXS, [ 234 ] so the discussion here is restricted to some recent highlights.…”
Section: X‐ray Scattering Methodsmentioning
confidence: 99%
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