Contribution of dielectric and metallic losses in RF/microwave tunable varactors using (Ba,Sr)TiO<sub>3</sub> thin films

Ayguavives, F.; Zhang, Jin; Tombak, A.; Maria, Jon Paul; Mortazawi, Amir; Kingon, Angus I.; Stauf, Gregory T.; Ragaglia, Craig; Roeder, Jeffrey F.; Brand, Mike

doi:10.1080/10584580108011963

Cited by 3 publications

(2 citation statements)

References 9 publications

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“…The disadvantage of that approach is, firstly, the need to intervene by creating a metal coating, and secondly, the uncertainties related to separating the metallization properties from the properties of the dielectric. Methods have been proposed [ 16 , 17 ] to overcome the latter problem, but there is a need for techniques to measure the microwave parameters of the dielectric film itself in its original state.…”

Section: Introductionmentioning

confidence: 99%

An Adaptation of the Split-Cylinder Resonator Method for Measuring the Microwave Properties of Thin Ferroelectric Films in a “Thin Film—Substrate” Structure

Gagarin,

Tsyganova,

Altynnikov

et al. 2024

Sensors

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The split-cylinder resonator method was adapted to measure the microwave properties (dielectric permittivity and loss tangent) of thin ferroelectric films on a dielectric substrate. The mathematical model for calculating the resonance frequency of the split-cylinder resonator was adjusted for the “ferroelectric film—substrate” structure. An approach for correcting the gap effect based on calibrating with a single-layer dielectric was introduced and used to study two-layer dielectrics. The prototype of a split-cylinder resonator designed to measure single-layer dielectric plates at a frequency of 10 GHz was presented. The resonator calibration was performed using dielectric PTFE samples and fused silica, and an example of the correction function was suggested. The measurement error was estimated, and recommendations on the acceptable parameter range for the material under investigation were provided. The method was demonstrated to measure the microwave properties of a ferroelectric film on a fused silica substrate.

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Section: Introductionmentioning

confidence: 99%

An Adaptation of the Split-Cylinder Resonator Method for Measuring the Microwave Properties of Thin Ferroelectric Films in a “Thin Film—Substrate” Structure

Gagarin,

Tsyganova,

Altynnikov

et al. 2024

Sensors

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“…[7]. The separation of the losses was made by the calculation of the metallic loss in assumption of the invariable BSTO loss in frequency range considered.…”

Section: Introductionmentioning

confidence: 99%

Separation of the Metallic and Dielectric Losses of Tunable Ferroelectric Capacitors Under Control Dc Voltage

Kotel'nikov¹,

Osadchy²,

Platonov³

et al. 2018

PIER Letters

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Abstract-An approach to separate the metallic and dielectric losses in ferroelectric capacitors in all range of tuning under control dc voltages (U dc ) is considered. The procedure is based on measurements of the dc voltage dependencies of microwave losses (tan δ t (U dc )) and capacitance (C(U dc )) for a set of capacitors with similar layout but with different nominals. Linear extrapolation of tan δ t (C) dependencies at different control dc voltages to C = 0 allows to evaluate the dielectric losses tan δ d as a function of the control dc voltage. The procedure of separation was performed for a set of sandwich metal/(Ba 0.5 Sr 0.5 )TiO 3 /metal capacitors. Capacitors parameters were measured at a frequency of 2 GHz in a range of electric field strength in ferroelectric of E = (0 − 30) V/µm. The intrinsic commutation quality factor of BSTO film itself was estimated by the method proposed.

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Dielectric dispersion and tunability of sol-gel derived Ba_xSr_1-xTiO₃thin films

Adikary¹,

Chan²

2004

Journal of Materials Science

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Contribution of dielectric and metallic losses in RF/microwave tunable varactors using (Ba,Sr)TiO₃ thin films

Cited by 3 publications

References 9 publications

An Adaptation of the Split-Cylinder Resonator Method for Measuring the Microwave Properties of Thin Ferroelectric Films in a “Thin Film—Substrate” Structure

An Adaptation of the Split-Cylinder Resonator Method for Measuring the Microwave Properties of Thin Ferroelectric Films in a “Thin Film—Substrate” Structure

Separation of the Metallic and Dielectric Losses of Tunable Ferroelectric Capacitors Under Control Dc Voltage

Dielectric dispersion and tunability of sol-gel derived Ba_xSr_1-xTiO₃thin films

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Contribution of dielectric and metallic losses in RF/microwave tunable varactors using (Ba,Sr)TiO3 thin films

Cited by 3 publications

References 9 publications

An Adaptation of the Split-Cylinder Resonator Method for Measuring the Microwave Properties of Thin Ferroelectric Films in a “Thin Film—Substrate” Structure

An Adaptation of the Split-Cylinder Resonator Method for Measuring the Microwave Properties of Thin Ferroelectric Films in a “Thin Film—Substrate” Structure

Separation of the Metallic and Dielectric Losses of Tunable Ferroelectric Capacitors Under Control Dc Voltage

Dielectric dispersion and tunability of sol-gel derived BaxSr1-xTiO3thin films

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Product

Resources

About

Contribution of dielectric and metallic losses in RF/microwave tunable varactors using (Ba,Sr)TiO₃ thin films

Dielectric dispersion and tunability of sol-gel derived Ba_xSr_1-xTiO₃thin films