Contrast in the transmission mode of a low‐voltage scanning electron microscope

Golla, U.; Schindler, Bernd; Reimer, Ludwig

doi:10.1111/j.1365-2818.1994.tb03444.x

Cited by 27 publications

(12 citation statements)

References 18 publications

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Contrasting

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“…1 STEM-in-SEM operation was particularly useful for biological and particulate specimens, where the electron beam penetration at normal SEM operating conditions (20-30 kV) are sufficiently high to gain contrast from dense, high atomic number inclusions into soft surroundings. 7,8 A STEM-in-SEM image (20 kV beam voltage) of the Pd particle distribution on the microtubule surface is shown in Fig. 1.…”

Section: Resultsmentioning

confidence: 99%

Characterization of metal decorated protein templates by scanning electron/scanning force microscopy and microanalysis

Habicht¹,

Behrens²,

Wu³

et al. 2004

Surface & Interface Analysis

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Highly ordered protein assemblies have been used as bio-organic templates either for the alignment of metallic nanoparticles or for the generation of continuous nanowires. A defined metallization of microtubules (MTs) is potentially interesting for the fabrication of conductive nanowires. Characterization of the in vitro assembled biomolecular templates and the subsequent metal deposition was performed by electron microscopic methods (SEM, TEM) and by scanning force microscopy (SFM). The SEM was equipped additionally with a special device to obtain transmission-type images (STEM-in-SEM operation). Palladium particle deposition and also a continuous silver coverage of the protein templates was demonstrated.

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Section: Resultsmentioning

confidence: 99%

Characterization of metal decorated protein templates by scanning electron/scanning force microscopy and microanalysis

Habicht¹,

Behrens²,

Wu³

et al. 2004

Surface & Interface Analysis

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show abstract

“…The samples must not be totally electron transparent for the purposes here, i.e. 1b), but by employing a special transmission setup (Golla et al, 1994) commercialized by Zeiss (Golla-Schindler & Schindler, 2004;see Figs. In fact, in the light of the supporting film approach, the more electron "nontransparent" the particles are, the higher the resulting transmission contrast is.…”

Section: Methodsmentioning

confidence: 99%

“…The first investigations of its application were made during the 1970s (Crawford & Liley, 1970;Woolf et al, 1972;Reimer et al, 1979;Grillon, 2006). It shall be also noted that the study presented here is performed with a special version of a TSEM setup (Golla et al, 1994;Golla-Schindler & Schindler, 2004), which to the knowledge of the authors, has not been previously used for such purposes. Exploitation of the TSEM for metrological tasks such as accurate measurement of NP size and size distribution was successfully demonstrated recently with field emission SEM having attached a STEM detector by a group in Germany (Buhr et al, 2009;Klein et al, 2011).…”

Section: Introductionmentioning

confidence: 99%

Performance of High-Resolution SEM/EDX Systems Equipped with Transmission Mode (TSEM) for Imaging and Measurement of Size and Size Distribution of Spherical Nanoparticles

et al. 2014

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The analytical performance of high-resolution scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDX) for accurate determination of the size, size distribution, qualitative elemental analysis of nanoparticles (NPs) was systematically investigated. It is demonstrated how powerful high-resolution SEM is by using both mono- and bi-modal distributions of SiO2 airborne NPs collected on appropriate substrates after their generation from colloidal suspension. The transmission mode of the SEM (TSEM) is systematically employed for NPs prepared on thin film substrates such as transmission electron microscopy grids. Measurements in the transmission mode were performed by using a "single-unit" TSEM transmission setup as manufactured and patented by Zeiss. This alternative to the "conventional" STEM detector consists of a special sample holder that is used in conjunction with the in-place Everhart-Thornley detector. In addition, the EDX capabilities for imaging NPs, highlighting the promising potential with respect to exploitation of the sensitivity of the new large area silicon drift detector energy dispersive X-ray spectrometers were also investigated. The work was carried out in the frame of a large prenormative VAMAS (Versailles Project on Advanced Materials and Standards) project, dedicated to finding appropriate methods and procedures for traceable characterization of NP size and size distribution.

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“…One particular analytical option, which was exploited successfully for the experiments of characterization of the nanoparticles in this project, is the transmission mode in a SEM. The methodology is not exactly new but in the meantime can be successfully applied to highly relevant materials such as nanoparticles. Recently, traceable measurement of nanoparticle size and size distribution has been demonstrated with the so‐called transmission SEM (T‐SEM) used in conjunction with high‐resolution SEM .…”

Section: Introductionmentioning

confidence: 99%

Inspection of morphology and elemental imaging of single nanoparticles by high‐resolution SEM/EDX in transmission mode

Hodoroabă

Rades

Unger

2014

Surface & Interface Analysis

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In the frame of the European project NanoValid, potential candidates of reference nanomaterials are manufactured and systematically characterized in particular with respect to their morphology (shape, size and size distribution). In this study, by exploiting the transmission operation mode in a high‐resolution SEM, known as transmission SEM, the potential of this methodical approach is demonstrated by means of representative examples of nanoparticles. The method enables quick and accurate morphological inspection and systematic characterization. Energy dispersive X‐ray spectroscopy imaging of single nanoparticles by using the transmission mode is demonstrated as feasible, too. Copyright © 2014 John Wiley & Sons, Ltd.

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Contrast in the transmission mode of a low‐voltage scanning electron microscope

Cited by 27 publications

References 18 publications

Characterization of metal decorated protein templates by scanning electron/scanning force microscopy and microanalysis

Characterization of metal decorated protein templates by scanning electron/scanning force microscopy and microanalysis

Performance of High-Resolution SEM/EDX Systems Equipped with Transmission Mode (TSEM) for Imaging and Measurement of Size and Size Distribution of Spherical Nanoparticles

Inspection of morphology and elemental imaging of single nanoparticles by high‐resolution SEM/EDX in transmission mode

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