“…In the past, numerous models have been developed to describe the insertion/extraction of Li in an electrode as diffusion of interstitial atoms in a host material (García et al, 2005;Christensen and Newman, 2006a,b;Zhang et al, 2007Zhang et al, , 2008Verbrugge, 2008, 2009;Deshpande et al, 2010a,b;Haftbaradaran et al, 2010Haftbaradaran et al, , 2011Yang, 2010), a subclass of problems more broadly referred to as the diffusion induced stresses (DIS) (Prussin, 1961;Li, 1978;Yang, 2005). In comparison, relatively few studies have explicitly considered crack nucleation under DIS.…”