1999
DOI: 10.1002/(sici)1521-396x(199911)176:1<35::aid-pssa35>3.0.co;2-2
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Continuous-Wave Operation of InGaN Multi-Quantum-Well Laser Diodes Grown on an n-GaN Substrate with a Backside n-Contact

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Cited by 5 publications
(3 citation statements)
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“…Also, the fabrication process used to mass-produce these LDs will have to be simple and reliable, and thus inexpensive. We have recently achieved room-temperature continuous operation of high-performance InGaN multi-quantum-well (MQW) laser diodes (LDs) in the context of solving the above-mentioned problems [3,4], for which the MQW laser structure was grown on the Facet-Initiated Epitaxial Lateral Overgrowth (FIELO)-GaN substrate and n-contact was made at the backside of substrate. This was made possible by introducing an important new concept of reducing threading dislocations (FIELO) during the growth of the GaN substrates.…”
mentioning
confidence: 64%
“…Also, the fabrication process used to mass-produce these LDs will have to be simple and reliable, and thus inexpensive. We have recently achieved room-temperature continuous operation of high-performance InGaN multi-quantum-well (MQW) laser diodes (LDs) in the context of solving the above-mentioned problems [3,4], for which the MQW laser structure was grown on the Facet-Initiated Epitaxial Lateral Overgrowth (FIELO)-GaN substrate and n-contact was made at the backside of substrate. This was made possible by introducing an important new concept of reducing threading dislocations (FIELO) during the growth of the GaN substrates.…”
mentioning
confidence: 64%
“…Compositions, functions, thicknesses and doping levels of all structure layers as well as their laser-axis values of refractive indices and extinction coefficients determined for the RT threshold-operating device. Numerical data are taken from Palik (1985), Bergmann and Casey (1998), Katoh et al (1998), Kuramato et al (1999), Chung et al (2000) and Kuroda and Takeuchi (2000).…”
Section: The Modelmentioning
confidence: 99%
“…Table 2 summarizes the deduced differential gains and device parameters used to calculate the differential gain for each sample. The internal optical loss was measured by the dependence of the external quantum efficiency on the cavity length [12], and the optical confinement factor was calculated by solving the Maxwell equations. The estimated differential gains of samples A, B and C were 120 × 10 −18 , 150 × 10 −18 and 50 × 10 −18 cm 2 , respectively.…”
Section: Differential Gain and In Fluctuationmentioning
confidence: 99%