Continuous-wave laser-induced glass fiber generation

Nishioka, Nobuyasu; Hidai, Hirofumi; Matsusaka, Satoshi; Chibá, Akira; Morita, Noboru

doi:10.1007/s00339-017-1210-0

Cited by 3 publications

(2 citation statements)

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“…A 3D PIC code (Keio-BFX) is used to study the effect of S H-on d eff . Detailed explanations of the Keio-BFX code have already been reported [12][13][14]. Herein, the model used in the present study is briefly summarized using the Keio-BFX code.…”

Section: Simulation Modelmentioning

confidence: 99%

“…To elaborate, as pointed out in Ref. [13], the Coulomb collision between a surface-produced Hion and H + ion in the plasma is critical with regards to velocity reversal and the resultant Hdensity profile around the extraction aperture. The surfaceproduced Hions originally penetrate towards the center of the ion source from the PG.…”

Section: Summary and Future Problemsmentioning

confidence: 99%

See 1 more Smart Citation

Effect of Surface Produced H<sup>- </sup>Ion on the Plasma Meniscus in Negative Hydrogen Ion Sources

HAYASHI

Hoshino

Hatayama

et al. 2023

Plasma and Fusion Research

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To extract intense ion beams with good beam optics from ion sources, controlling the distance d eff between the plasma meniscus (i.e., beam emission surface) and the beam extraction grid is important. This study conducts a novel investigation into the dependence of the effective distance d eff on the amount of surface Hproduction S H-. For this purpose, a 3D PIC (three dimensional Particle-in-Cell) simulation is conducted to obtain a model geometry of the extraction region for a Hion source with S H-as a parameter. Based on results, d eff significantly depends on S H-and the H --electron density ratio (α = n H -/n e ) in front of the extraction aperture for the same plasma density; as S H-increases, d eff decreases. The results suggest that S H-is critical for controlling d eff and the resultant beam optics extracted from the negative ion source. c

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Section: Simulation Modelmentioning

confidence: 99%

Section: Summary and Future Problemsmentioning

confidence: 99%