Comprehensive Semiconductor Science and Technology 2011
DOI: 10.1016/b978-0-44-453153-7.00118-8
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Contacts to Wide-Band-Gap Semiconductors

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Cited by 7 publications
(1 citation statement)
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“…However, the understanding and control of ZnO/metal contacts still represents a challenge, as shown by the wide range of barrier height values measured for the same metal on a given ZnO surface. This puzzling ZnO behavior exasperates a common phenomenon among wide-gap semiconductors, 3,4 and represents a manifest failure of simplified models that neglect the dependence of the Schottky barrier height (SBH) on the interface details, such as the Schottky-Mott rule, where the Schottky barrier is evaluated as the difference between the metal work function and the semiconductor electron affinity.…”
Section: Introductionmentioning
confidence: 99%
“…However, the understanding and control of ZnO/metal contacts still represents a challenge, as shown by the wide range of barrier height values measured for the same metal on a given ZnO surface. This puzzling ZnO behavior exasperates a common phenomenon among wide-gap semiconductors, 3,4 and represents a manifest failure of simplified models that neglect the dependence of the Schottky barrier height (SBH) on the interface details, such as the Schottky-Mott rule, where the Schottky barrier is evaluated as the difference between the metal work function and the semiconductor electron affinity.…”
Section: Introductionmentioning
confidence: 99%