“…The ε ′ of Ni x S y @De and Ni x S y @De-etched show a decreasing trend with increasing frequency, which can be attributed to the characteristic dispersion response due to the enhanced hysteresis of the dipole polarization response to the electric field, which also improves the impedance matching of the incident microwave. 50,51 The ε ′ and ε ′′ values of the last two samples undergo a huge enhancement with respect to Ni(OH) 2 @De, suggesting that sulfide increases the dielectric properties of the samples in the form of phase components, vacancies, and defects. 52 The presence of abundant defects and a large number of interfaces after sulfurization was demonstrated by XRD, EPR, and SEM, leading to significant polarization, 53 thus synergistically contributing to the dielectric attenuation performance.…”