Constant voltage I–V curve flash tester for solar cells

Keogh, William; Blakers, Andrew; Cuevas, Andrés

doi:10.1016/j.solmat.2003.11.001

Cited by 47 publications

(28 citation statements)

References 12 publications

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“…Wiemken et al studied the effect of combined power generation by monitoring data obtained from PV panels for possible modification to have improved efficiencies [113]. Keogh et al developed a new tester, used for measuring solar cells and modules, which is simple, low cost and reducing transient errors [114].…”

Section: Design Improvements and Sizingmentioning

confidence: 99%

Solar energy for future world: - A review

Nadarajah

Vakeesan

2016

Renewable and Sustainable Energy Reviews

1,436

485

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Section: Design Improvements and Sizingmentioning

confidence: 99%

Solar energy for future world: - A review

Nadarajah

Vakeesan

2016

Renewable and Sustainable Energy Reviews

1,436

485

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“…Result also demonstrated the influence from OPV capacitance during the measurement of I-V curves by using a steady-state simulator. RTOSM [8] certainly speeds up the characteristic research of OPV to get more reasonable result (Table 2, Fig. 5).…”

Section: Discussionmentioning

confidence: 87%

“…Dynamic measure-single points (Hold-time) [8][9][10][11] Multi-flash single points [2,3] One-sweep method [7] Measurement Meanwhile, after reading the multi-point forming step, take a little at steady state as a point on the I-V curve -0.02 5,000 6,000 7,000 8,000 9,000 10,000…”

Section: Itemmentioning

confidence: 99%

Induction of Internal Capacitance Effect in Performance Measurement of OPV (Organic Photovoltaic) Device by RTOSM (Real-Time One-Sweep Method)

Long¹,

Hsu²,

Wu³

2014

JEPE

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Abstract:The advantages of OPV (organic photovoltaic) are low cost, little pollution and flexible. But challenge for OPV manufacture still is lacking of accurately performance measurement due to capacitance issue. Firstly, characterization of OPV requires considering the slowly temporal response due to capacitance effect, and the relative I-V (current-voltage) curves are strongly dependent on the voltage sweep direction, even for the sweep time only in few seconds or less. Secondly, the IPCE (incident photon-to-electron conversion efficiency) also shows the slowly temporal response due to capacitance effect and is dependent on the wavelength of the incident light. Furthermore, the related features for measuring I-V curves are more sensitive with temperature due to non-linear characteristics issue, but current IPCE spectra of OPV are similar to that happened in conventional crystalline Si or amorphous silicon devices. In this work, we developed a RTOSM (real-time one-sweep method) applied both in I-V and IPCE to analysis different electronic transport materials, and result showed this new approach proposed a good way to slow down testing time and having better accuracy for OPV measurement by eliminating acceptance effect instantly.

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“…In the former case the measurements can be performed under dark or illuminated conditions, in the latter case solar simulators being used [6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25].…”

Section: Methods Usedmentioning

confidence: 99%