2006
DOI: 10.1117/1.2219097
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Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment

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Cited by 10 publications
(10 citation statements)
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“…In this configuration, the phase of the signal can be used giving a much higher resolution than the frequency [5] ( figure 4). The problem of the phase is that it wraps around 2π, so measurements of surfaces with discontinuities can not be unambiguously recovered; work is being done to eliminate or reduce this limitation by means of double wavelength illumination [6].…”
Section: Conoscopic Holography Long Stand-off Profilometermentioning
confidence: 97%
“…In this configuration, the phase of the signal can be used giving a much higher resolution than the frequency [5] ( figure 4). The problem of the phase is that it wraps around 2π, so measurements of surfaces with discontinuities can not be unambiguously recovered; work is being done to eliminate or reduce this limitation by means of double wavelength illumination [6].…”
Section: Conoscopic Holography Long Stand-off Profilometermentioning
confidence: 97%
“…Processing considerations using this method have already been reported. 12,13,15 It is possible to speed up the processing task using Phase Shifting algorithms applied just to a few rows of the fringe pattern, 16 the pattern can be seen as spatial carrier fringes with the same information coded in every row. If the processed row corresponds with the optical axis of the system, the obtained phase is ϕ 0 , otherwise the changes in the OPD due to the added distance in the vertical coordinate of the fringe pattern must be considered.…”
Section: Profilometer Working Principlementioning
confidence: 99%
“…By measuring the phase instead of the fringe frequency, precision is increased in, at least, one order of magnitude. 12 In order to extract the distance information z from the fringe pattern to the detection plane, both frequency and phase signals can be used. Usual processing methods are based on Fourier Transform methods 9 or Spatial Carrier Phase Shifting.…”
Section: Profilometer Working Principlementioning
confidence: 99%
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“…Optical metrology possesses the advantages of being a non-contact method and having high resolution and efficiency for workpiece contour measurement and surface quality inspection. Several methods exist for measuring optical topography, including the stereoscopic method, structured light, laser triangulation, conoscopic holography, the moiré method, and heterodyne interferometry [1,2,3,4,5,6,7,8,9,10,11,12,13].…”
Section: Introductionmentioning
confidence: 99%