2004
DOI: 10.1016/j.forsciint.2004.03.017
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Conjunctive use of quantitative and qualitative X-ray diffraction analysis of soils and rocks for forensic analysis

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Cited by 66 publications
(42 citation statements)
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“…This range of SWL value is comparable to the SWL values from samples in this present study. However, Ruffell and Wiltshire's (2004) samples have a higher average LOI value of 9.8% than the average LOI of 6.67% for samples measured in this study, although Ruffell and Wiltshire (2004) used slightly different temperature steps and heating durations.…”
Section: Discussioncontrasting
confidence: 57%
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“…This range of SWL value is comparable to the SWL values from samples in this present study. However, Ruffell and Wiltshire's (2004) samples have a higher average LOI value of 9.8% than the average LOI of 6.67% for samples measured in this study, although Ruffell and Wiltshire (2004) used slightly different temperature steps and heating durations.…”
Section: Discussioncontrasting
confidence: 57%
“…Based upon the LOI data from Table 2, efforts were made to use the quantitative XRD mineral modal abundance reported by Ruffell and Wiltshire (2004) to calculate the SWL and SWL:LOI values for their soil samples. For the 21 surface soil samples collected from various locations by Ruffell and Wiltshire (2004), their SWL ranged from 0.03 to 5.55%.…”
Section: Discussionmentioning
confidence: 99%
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“…Perhaps in such circumstances it would be better not to use elemental chemical analyses at all (given the inherent problems that such techniques pose, as outlined above). If geochemical analyses were required, perhaps XRF analysis (which has been recognised as having greater accuracy [9]) or XRD analysis, that is able to provide mineralogical data from small samples [11], or indeed QemSCAN analysis [12] would be more appropriate.…”
Section: Introductionmentioning
confidence: 99%