Confocal scanning microscopy with multiple optical probes for high speed measurements and better imaging

Chun, Wanhee; Lee, SeungWoo; Gweon, Dae−Gab

doi:10.1117/12.763253

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SPIE Proceedings

2008

DOI: 10.1117/12.763253

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Confocal scanning microscopy with multiple optical probes for high speed measurements and better imaging

Wanhee Chun

SeungWoo Lee

Dae−Gab Gweon

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Confocal scanning microscopy with multiple optical probes for high speed measurements and better imaging

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