Conduction in Non-Crystalline Materials

Mott, N. F.; Galligan, J. M.

doi:10.1115/1.3226457

Cited by 107 publications

(120 citation statements)

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“…The present results indicate that this is not the case. For conduction to take place in the valence-band tail the dc activation energy should be greater than the thermopower activation energythis is also the condit' ,ion required for small-polaron conduction [22]. The present results seem to fit this type conduction mechanism a t temperatures between 333 and 513 K ; the thermopower activation energy is smaller than the conductivity activation energy by about 20 meV, the exact value being temperature-dependent.…”

Section: Thermopowersupporting

confidence: 46%

Thermopower and DC electrical conductivity in Au/SiO thin cermet films

Steele¹,

Beyston²

1988

Phys. Stat. Sol. (a)

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Thermopower and dc electrical conductivity measurements are made on Au/SiO (16 at% Au) cermet films, 90 nm thick, prepared by co‐evaporation in vacuo ≈ 1 mPa in the temperature range 164 to 513 K. The thermopower, dc conductivity, and their respective activation energies are fitted to a polynomial expression in 1/T. Above 333 K the experimental results agree well with the small polaron theory whereas below 333 K, multi‐phonon processes are frozen out and it is not possible to distinguish between small polarons and non‐polaronic carriers. The carrier concentration is ≈1022 cm−3. The Benedicks effect is observed in high resistive (>350 Ωcm) cermet films.

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Section: Thermopowersupporting

confidence: 46%

Thermopower and DC electrical conductivity in Au/SiO thin cermet films

Steele¹,

Beyston²

1988

Phys. Stat. Sol. (a)

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“…This technique allows the temperature and frequency dependence of the electrical conductivity to be studied. In order to investigate the physical origin of the occurring charge transport, different hopping models (variable range hopping 27,28 and random free-energy barrier models 29,30 ) have been employed and applied to analyze the ac data.…”

Section: Introductionmentioning

confidence: 99%

Electrical conductivity properties of expanded graphite-polycarbonatediol polyurethane composites

et al. 2014

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“…(1). Several theoretical models, including 1D Mott's variable range hopping [36], Efron-Schklovskii hopping [24], and granular metallic hopping [37], can be described by the same format of Eq. (1) thus the I-V behaviors (Fig.…”

Section: Resultsmentioning

confidence: 99%

Dielectrophoretic placement of quasi‐zero‐, one‐, and two‐dimensional nanomaterials into nanogap for electrical characterizations

et al. 2012

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DEP is one of promising techniques for positioning nanomaterials into the desirable location for nanoelectronic applications. In contrast, the lithography technique is commonly used to make ultra-thin conducting wires and narrow gaps but, due to the limit of patterning resolution, it is not feasible to make electrical contacts on ultra-small nanomaterials for a bottom-up device fabrication. Thus, integrating the lithography and dielectrophoresis, a real bottom-up fabrication can be achieved. In this work, the device with the nanogap in between two nanofinger-electrodes is made using electron-beam lithography from top down and the ultra-small nanomaterials, such as colloidal PbSe quantum dots, polyaniline nanofibers, and reduced-graphene-oxide flakes, are placed in the nanogap by DEP from bottom up. The threshold electric field for the DEP placement of PbSe nanocrystals was roughly estimated to be about 8.3 × 10(4) V/cm under our experimental configuration. After the DEP process, several procedures for reducing contact resistances are attempted and measurements of intrinsic electron transport in versatile nanomaterials are performed. It is experimentally confirmed that electron transport in both PbSe nanocrystal arrays and polyaniline nanofibers agrees well with Prof. Ping Sheng's model of granular metallic conduction. In addition, electron transport in reduced-graphene-oxide flakes follows Mott's 2D variable-range-hopping model. This study illustrates an integration of the electron-beam lithography and the DEP techniques for a precise manipulation of nanomaterials into electronic circuits for characterization of intrinsic properties.

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Conduction in Non-Crystalline Materials

Cited by 107 publications

References 0 publications

Thermopower and DC electrical conductivity in Au/SiO thin cermet films

Thermopower and DC electrical conductivity in Au/SiO thin cermet films

Electrical conductivity properties of expanded graphite-polycarbonatediol polyurethane composites

Dielectrophoretic placement of quasi‐zero‐, one‐, and two‐dimensional nanomaterials into nanogap for electrical characterizations

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