Conditions for and limitations of high-power handling capabilities of planar YBa2Cu3O7-x filters

Hein, Matthias; Bauer, C.; Diete, W.; Hensen, S.; Kaiser, Thomas; Müller, Günter; Piel, H.

doi:10.1007/bf02763180

Cited by 32 publications

(27 citation statements)

References 21 publications

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“…R, was measured at 8. 5 The microstructure of the films was investigated by X-ray diffraction (XRD) using a Philips X'Pert 4-circle diffractometer, by thorough optical inspection, and by transmission and scanning electron microscopy (TEM at 200 and 400 kV as well as large-area SEM inspection).…”

Section: Methodsmentioning

confidence: 99%

Microstructure and microwave surface resistance of YBaCuO thin films

Kästner¹,

Schäfer²,

Senz³

et al. 1999

IEEE Trans. Appl. Supercond.

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Epitaxial YBaCuO thin films on 73 mm diam. sapphire and 50 mm LaAlO3 wafers prepared for microwave applications were characterized by optical and electron microscopy as well as by X-ray diffraction in order to guide optimizing the film properties. The surface resistance R,, measured at 8.5, 19 or 145 GHz, partially as a function of microwave field amplitude B,, was taken as the key parameter. m i c a 1 results scaled quadratically in frequency to 0.25-0.75 mR at 10 GHz, 77 K, and low field levels. In case of sapphire substrates, a challenge for applications is microcracking of the films. However, cracks are less deleterious if "dispersed" by other heterogeneities such as a-oriented grains. Narrow microcracks should allow for tunnel currents and flux pinning. In case of LaA103, films sensitive to high microwave power exhibited some inplane rotational misorientation and a-oriented grains as well as inhomogeneous layering of these grains and of additional Cu-0 planes within the film thickness, with possible influence on R,.

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Section: Methodsmentioning

confidence: 99%

Microstructure and microwave surface resistance of YBaCuO thin films

Kästner¹,

Schäfer²,

Senz³

et al. 1999

IEEE Trans. Appl. Supercond.

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“…1 This problem is particularly severe in microstrip filters because of the singularity of the edge current density. 2,3 However, in the TM 010 mode of a thin film disk resonator, the current density vanishes on the edge and has only a modest Bessel function variation with the radius. This mode has therefore been considered for higher power structures such as transmit filters and power combiners.…”

Section: ͓S0021-8979͑99͒04819-7͔mentioning

confidence: 99%

Microwave intermodulation of a superconducting disk resonator

Dahm

Scalapino

Willemsen

1999

Journal of Applied Physics

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We calculate the third order intermodulation products for the TM010 mode of a thin film disk resonator and discuss the particular case of a 1 GHz resonator in order to obtain a quantitative idea of the performance that can be obtained. The linear and nonlinear microwave responses of a TM010 disk resonator are then compared to that of an equivalent half wavelength microstrip resonator. This analysis allows one to independently quantify the contributions to the nonlinear device performance from the material properties, device size and field configuration.

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“…The total dissipated power (used for calculations of ) is derived in [8] as (15) where is the ratio of the electrical energy stored outside the dielectric rod to that stored inside, namely (16) Equations used in the derivation of in [8] describe the EM fields outside the dielectric rod valid for resonators with infinite radius (and hence neglect any reflections from cavity walls or power dissipated in the walls) in the following form: (17) Solving (15) for and using (7) Shen et al obtained an equation for the maximum RF magnetic field in a resonator of infinite diameter as (18) For a general case of a resonator shielded in a cavity EM fields described by (4)-(6) should be considered. We have derived (as shown in the Appendix) the following expression to describe for a resonator with a cavity of radius , dielectric rod of radius , and HTS films of the radius (19) The maximum RF magnetic field determines the maximum surface current density on the HTS films, as currents on two surfaces have the same distribution as the component of the magnetic field, . In reality the RF currents are volume, not surface currents, and the problem of how to account for these volume effects for HTS thin films on dielectric substrates arises.…”

Section: B Quality Factor Stored Energy Circulatng Power Geometrimentioning

confidence: 99%

“…9. Relative error in maximum RF magnetic field between (19) and (18) versus cavity-to-sapphire radius ratio. Fig.…”

Section: Influence Of Dielectric Resonators' Design On the Circumentioning

confidence: 99%

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Circulating power, RF magnetic field, and RF current density of shielded dielectric resonators for power handling analysis of high-temperature superconducting thin films of arbitrary thickness

Mazierska

Grabovickic

1998

IEEE Trans. Appl. Supercond.

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In the current quest for HTS films with negligible power effects at high RF power levels for wireless communications, accurate calculations of a maximum RF magnetic field H max and of a maximum RF current density J max flowing on the surface of superconducting films is necessary to allow for any sensible conclusions and comparisons. As the dielectric resonator method is used most frequently for investigation of HTS losses, the authors discuss in this paper a dependence of the circulating power and of a maximum RF magnetic field H max on dielectric resonators' geometry as well as of the maximum RF current density J max flowing on the surface of superconducting films on the films' thickness, for a general case of a resonator shielded in a metallic cavity. The authors' results demonstrate that under the same input power levels the same HTS films may be exposed to differing RF power level conditions, depending on the cavity to dielectric radius ratio and thickness of superconducting films. This means that there may be a significant discrepancy between calculated and real power handling capabilities of HTS films tested in different dielectric resonators unless correct formulas are used.

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Conditions for and limitations of high-power handling capabilities of planar YBa2Cu3O7-x filters

Cited by 32 publications

References 21 publications

Microstructure and microwave surface resistance of YBaCuO thin films

Microstructure and microwave surface resistance of YBaCuO thin films

Microwave intermodulation of a superconducting disk resonator

Circulating power, RF magnetic field, and RF current density of shielded dielectric resonators for power handling analysis of high-temperature superconducting thin films of arbitrary thickness

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