Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopy

Weppelman, I.G.C.; Moerland, Robert J.; Hoogenboom, Jacob P.; Kruit, P.

doi:10.1016/j.ultramic.2017.10.002

Cited by 25 publications

(19 citation statements)

References 44 publications

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“…However, several blanking methods are emerging as an alternative, in which an electron beam is periodically deflected over a small slit or aperture [19][20][21] . These methods have the advantage that no alterations have to be made to the electron source.…”

Section: A Ultrafast Electron Microscopymentioning

confidence: 99%

Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopy

Verhoeven

Rens

Kemper

et al. 2019

Review of Scientific Instruments

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Section: A Ultrafast Electron Microscopymentioning

confidence: 99%

Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopy

Verhoeven

Rens

Kemper

et al. 2019

Review of Scientific Instruments

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“…To realize the pulsed beam below 580 fsec time width with high spatial and temporal coherence, we have developed a double-deflector chopping system that cancels the dynamic motion of the beam, whereas a single beam deflector inevitably causes beam motion [21]. The newly deflector cavities are properly controlled, the deviation of the electron trajectory from the optical axis is canceled (see Supplemental Material [20]).…”

Section: (B)mentioning

confidence: 99%

Transmission Electron Microscope Using a Linear Accelerator

Sannomiya

Arai²,

Nagayama

et al. 2019

Phys. Rev. Lett.

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High voltage transmission electron microscopes (HVTEMs), which can visualize internal structures of micron thick samples, intrinsically have large instrument sizes because of the static voltage isolation. In this study we developed a compact HVTEM, employing a linear accelerator, a subpicosecond beam chopper, and a linear decelerator. 100 kV electrons initially accelerated by static field are accelerated at radio frequency (RF) up to 500 kV, transmitting through the sample and finally RF-decelerated down to 200 kV to be imaged through a 200 kV energy filter. 500 kV imaging, as well as a sub-nanometer resolution at 200 kV has been demonstrated.

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“…Although photoemission is commonly used in UTEM systems, there is an interesting alternative to use a blanking method, where a continuous beam is periodically swept across a slit or aperture [6,7,8]. Creating pulses in this way has the advantages that amplified laser systems are no longer required, and that no intrusive alterations to the source have to be made.…”

Section: Introductionmentioning

confidence: 99%

High quality ultrafast transmission electron microscopy using resonant microwave cavities

et al. 2018

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Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of 814 ± 2 pA, the root-mean-square transverse normalized emittance of the electron pulses is ɛ=(2.7±0.1)·10 m rad in the direction parallel to the streak of the cavity, and ɛ=(2.5±0.1)·10 m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is ɛ=ɛ=(2.5±0.1)·10 m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of 0.95 ± 0.05 eV has been measured.

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Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopy

Cited by 25 publications

References 44 publications

Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopy

Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopy

Transmission Electron Microscope Using a Linear Accelerator

High quality ultrafast transmission electron microscopy using resonant microwave cavities

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