Concentric Nano Elliptical Apertures Array Tip for Intensity Enhancement in Scanning Near-Field Optical Microscopy for Imaging

Abstract

<p>The usage of electromagnetic computations to analyze the optical responses of microscopic devices, realizes this path to obtain the reliable results. Hence the main landscape of this scientific paper on the basis of computational assessments is the representation of a different array tip to ameliorate intensity of propagated and transmitted beams in near and far-fields, respectively to achieve the more excellent intensity compared with the used prior designs. </p>