2019
DOI: 10.1016/j.tsf.2018.11.038
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Concentration of defects responsible for persistent photoconductivity in Cu(In,Ga)Se2: Dependence on material composition

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Cited by 6 publications
(9 citation statements)
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“…Recently, it was reported that the Na content of the sample has an influence on the density of metastable defects. [ 19,37 ] However, the samples investigated here show no correlation of the diode factor with the integral Na or K content of the sample (Figure S12e,f, Supporting Information).…”
Section: Discussionmentioning
confidence: 89%
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“…Recently, it was reported that the Na content of the sample has an influence on the density of metastable defects. [ 19,37 ] However, the samples investigated here show no correlation of the diode factor with the integral Na or K content of the sample (Figure S12e,f, Supporting Information).…”
Section: Discussionmentioning
confidence: 89%
“…Light soaking induces a metastably increased net acceptor density in the CIGS absorber layer. [17][18][19][20][21] To measure the increased net acceptor density without relaxation during the measurement, the sample was cooled down to low temperatures, while the illumination was kept on. At set-point temperature, the illumination was switched off and the capacitance-voltage curve was measured under dark conditions at an AC amplitude of 30 mV and a probing frequency of 100 kHz.…”
Section: Methodsmentioning
confidence: 99%
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“…10 However, to our knowledge, there have been fewer experimental studies linking the electronic properties of ACIGS with defect-induced metastability. 12 Here, we probe the influence of environmental stress (dark-heat exposure at 85°C for 1000 h and/or light-soaking under simulated 1 sun AM1.5G illumination for 24 h) on the device performance and charge carrier dynamics in penternary ACIGS absorbers. Through control of the selenization conditions prior to absorber growth and the application of a suite of experimental techniques, we correlate the observed changes to the ACIGS trap/ defect properties.…”
Section: Journal Of Applied Physicsmentioning
confidence: 99%