Computer program TRACK_TEST for calculating parameters and plotting profiles for etch pits in nuclear track materials

A New Method to Determine the Maximum Value of the Track Length of Alpha Particle in CR-39 Detector

“…We found the parameter 2.56. By comparing the results of L max that we obtained directly from Brun et al function by using TRACK_TEST program with the results that we obtained by using Equation (1), we observed that Equation (1) will give me correct results for the maximum values of the track length alpha particles if we multiplied it with 2.56. and we found this parameter by dividing the value of L max from Brun et al function over the theoretical value of L max from Equation (1) for the same used energy, and after multiplying the theoretical values that we obtained by using Equation (1) by the factor 2.56 (Equation (2)), we got values very close to the maximum values of the track lengths that we obtained directly from Brun et al function [18] by using TRACK_TEST program [1].…”

“…The values of diameter square (D 2 ) have been plotted versus etching time (t) for the data that we obtained from Brun et al function [18], and from Nikezic and Yu et al function [19] by using TRACK_TEST program [1] for CR-39 detector for the two functions with different energies of alpha particles as shown in (Figures 1-4). We showed from the figures the non-linear relationships between the etching time and the diameter squares of the of alpha particles and by taking the fitting of the straight line of the curve we measured the slope of the linear part and the intercept with the x-axis, and then we could calculate the L max of alpha particle in the CR-39 detector by using the Equation (1) but after multiplying it with 2.56.…”

“…Let us now take the same kind of L max measurements directly from Yu et al function [19] in TRACK_TEST program [1], and then compare the results of L max theoretically that we obtained by using Equation (2) from the data between the etching time and the diameter square (t & D 2 ) that we obtained from Yu et al function [19] in TRACK_TEST program [1]. We found that Equation (2) Figure 8 show the relation between etching time and the diameter square.…”

“…Through the etching, the latent track becomes visible as a particle "track" which may be seen under an optical microscope. The effect itself has been known for a long time, which is called the "track effect" [1]. The technique has been extensively investigated in the literature, and has been widely applied in many fields of science and technology [2].…”

“…Both normal and oblique incidences have been treated. A user computer program that can calculate track profiles under different conditions has been presented by Nikezic and Yu [1]. A new empirical equation describing the development of charged particles radiation track against etching time and the longitudinal depth of track is presented [15].…”