Computer Aided Design of Monolithic Microwave and Millimeter Wave Integrated Circuits and Subsystems

Ku, W.H.

doi:10.21236/ada213656

Cited by 1 publication

(2 citation statements)

References 4 publications

(8 reference statements)

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“…The crossing point (marked in Fig. 7) is also called Zero Temperature Coefficient (ZTC) and its effect is examined in several publications, see [18] for more details. Similarly, when considering logic threshold voltage of a gate, it was found that it also reduces as temperature increases.…”

Section: Incorporation Of Pvt Variationmentioning

confidence: 99%

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A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects

Zhong

Khursheed

Al-Hashimi

2011

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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Abstract-Recent research has shown that tests generated without taking process variation into account may lead to loss of test quality. At present there is no efficient device-level modeling technique that models the effect of process variation on resistive bridge defects. This paper presents a fast and accurate technique to achieve this, including modeling the effect of voltage and temperature variation using BSIM4 transistor model. To speedup the computation time and without compromising simulation accuracy (achieved through BSIM4) two efficient voltage approximation algorithms are proposed for calculating logic threshold of driven gates and voltages on bridged lines of a fault-site to calculate bridge critical resistance. Experiments are conducted on a 65-nm gate library (for illustration purposes), and results show that on average the proposed modeling technique is more than 53 times faster and in the worst case, error in bridge critical resistance is 2.64% when compared with HSPICE.Index Terms-Resistive bridge fault, fault model, manufacturing test, process variation.

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Section: Incorporation Of Pvt Variationmentioning

confidence: 99%

“…if I n,i ≥ I p,i then 18: Fig. 3 shows the algorithm for calculating logic threshold voltage of a gate, which is applicable to both simple and compound gates (such as OR4, AND4 and AO22).…”

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confidence: 99%