Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XV 2022
DOI: 10.1117/12.2610558
|View full text |Cite
|
Sign up to set email alerts
|

Computational optimization and the role of optical metrology in tomographic additive manufacturing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
1
1

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(4 citation statements)
references
References 8 publications
0
4
0
Order By: Relevance
“…In this example, the local refractive index (as shown in Figure 6(a)) is set to be proportional to the response target. The maximum index change relative to the surrounding is set to be 0.005, which is close to the measured index change of an example material (Urethane Dimethacrylate IPDI 33 ). Due to the complexity of the index distribution, the ray trajectories in Figure 6(b) do not carry any intuitive or interpretable pattern.…”
Section: Refraction In Gradient-refractive Index Mediamentioning
confidence: 98%
See 1 more Smart Citation
“…In this example, the local refractive index (as shown in Figure 6(a)) is set to be proportional to the response target. The maximum index change relative to the surrounding is set to be 0.005, which is close to the measured index change of an example material (Urethane Dimethacrylate IPDI 33 ). Due to the complexity of the index distribution, the ray trajectories in Figure 6(b) do not carry any intuitive or interpretable pattern.…”
Section: Refraction In Gradient-refractive Index Mediamentioning
confidence: 98%
“…This work assumes that the evolving refractive index distribution is known (e.g. measured by Color Schlieren Tomography 33,34 ) and spatially continuous (due to the band-limited reconstruction and material diffusion).…”
Section: Refraction In Gradient-refractive Index Mediamentioning
confidence: 99%
“…The light rays after the resin volume are then focused by a focusing lens which is placed one focal length away from the resin vial. A slit is placed at the focal plane of the focusing lens [14]. Depending on the ray deflection by the resin going through gelation, only light of certain color can pass through the slit and get collected by the camera.…”
Section: Color Schlierenmentioning
confidence: 99%
“…Color Schlieren technique is more robust against changes in scattering and achromatic absorbance. Color Schlieren provides contrast along one direction but holds the potential to encode RI along both vertical and horizontal directions by using a more sophisticated color filter [14,15]. RI changes as low as 10 -4 of a urethane dimethacrylate-based resin were detected by color Schlieren system [14,15].…”
Section: (C))mentioning
confidence: 99%