1996
DOI: 10.1103/physrevb.53.7714
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Compton-scattering study of the electronic properties of the transition-metal alloys FeAl, CoAl, and NiAl

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Cited by 20 publications
(12 citation statements)
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“…This is the first high statistics and high resolution measurement in these materials, which are difficult candidates for such experiments given the problems related to fluorescence background from heavy atoms and low count-rates due to absorption. These problems have been overcome thanks to high energy synchrotron radiation and dedicated instrumentation at ID15B at the ESRF [9,10]. Our measurements show that the experimental momentum density is similar to that given by LDA band-structure calculations for YBa 2 Cu 3 O 7−δ .…”
supporting
confidence: 69%
“…This is the first high statistics and high resolution measurement in these materials, which are difficult candidates for such experiments given the problems related to fluorescence background from heavy atoms and low count-rates due to absorption. These problems have been overcome thanks to high energy synchrotron radiation and dedicated instrumentation at ID15B at the ESRF [9,10]. Our measurements show that the experimental momentum density is similar to that given by LDA band-structure calculations for YBa 2 Cu 3 O 7−δ .…”
supporting
confidence: 69%
“…The spectra were collected using a hyperpure germanium solid-state detector, with an energy resolution of ∼500 eV at 122 keV. Although this leads to a momentum resolution 2-4 times worse than that obtainable using a scanning crystal spectrometer (see for example [29]), the acquisition of data by the latter is too slow for a systematic investigation. The data for each profile were collected over ∼36 hours, giving an integrated count under the Compton profile of 1.3 × 10 8 , which resulted in 8.3 × 10 5 counts in the MCP.…”
Section: The Measurementmentioning
confidence: 99%
“…The beam from such an extra reflection may reach the narrow but vertically extended receiving slit and contribute to detectable intensity, if the relp of the reflection lies in the vertical plane that is spanned by the nominal relp (440) and the vertical rotation axis, and thus fulfils the horizontal focusing condition at least approximately. This has been observed both for an off-focusing-plane reflection {(551) with [001] as the rotation axis} and for parasitic scattering excited by incident beam harmonics and reflected by other (hh0) of the analyser (Manninen et al, 1996;Suortti et al, 1999). Both types of unwanted irregular contributions to the measured spectrum are avoided in the present set-up by choosing the (311) reflection of the Si monochromator (overtones forbidden or very weak), and by choosing ½1 " 1 10 as the rotation axis of the analyser crystal (Suortti et al, 1999).…”
Section: Quantum Efficiency Function Of the Analysermentioning
confidence: 96%