Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices

Helleboid, Rémi; Rideau, D.; Nicholson, Isobel; Moussy, Norbert; Saxod, O.; Basset, M.; Grebot, Jeremy; Zimmerman, A. V.; Mamdy, Bastien; Golanski, Dominique; Agnew, Megan; Pellegrini, Sara; Sicre, Mathieu

doi:10.1109/essderc53440.2021.9631801

Cited by 4 publications

(3 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This empirical solver has been preliminarily calibrated to accurately reproduce the predictions of the Full Band one. One notes incidentally that this approach accounts for random carrier diffusion and is therefore more accurate than the previously used field-lines-based McIntyre model [9] as exemplified in Figure 3. In contrast to the McIntyre results, the empirical Monte Carlo predicts non-vanishing BrP in the lateral lower field region, as it is the case with the Full Band Monte Carlo predictions (see Figure 1-b).…”

Section: Full Band Monte Carlomentioning

confidence: 99%

Multiscale SPAD modeling: from Monte Carlo to SPICE simulations

Rideau,

HELLEBOID,

mugny

et al. 2023

Advanced Photon Counting Techniques XVII

View full text Add to dashboard Cite

We present a study of the main SPAD figures of merit using a multiscale approach, from Monte Carlo simulations to SPICE simulations. We explore novel stochastic approaches capable of predicting accurately experimental measurements such as the Breakdown Probability, and the jitter. Additionally, the SPAD avalanche dynamics that is a stochastic process, is discussed within a transient Monte Carlo simulation perspective. We also derived a VerilogA model, making possible the analysis of the stochastic responses of the SPAD, including the buildup of the avalanche but also its quench. This latter quench probability of these diodes once in avalanche, rarely discussed in literature, is related to the dynamics of the voltage change of the floating cathode node. If the cathode voltage recovery (after the debiasing due to the quench circuit) is quicker than the time needed for the carrier evacuation within the avalanche junction, small additional avalanches can occur.

show abstract

Section: Full Band Monte Carlomentioning

confidence: 99%

Multiscale SPAD modeling: from Monte Carlo to SPICE simulations

Rideau,

HELLEBOID,

mugny

et al. 2023

Advanced Photon Counting Techniques XVII

View full text Add to dashboard Cite

show abstract

“…The reference SPAD design used in this work is similar to the one presented in [4]. The junction is made of an N+ over P doping region.…”

Section: Introductionmentioning

confidence: 99%

Modeling of SPAD avalanche breakdown probability and jitter tail with field lines

Helleboid

Rideau

Grebot

et al. 2022

Solid-State Electronics

View full text Add to dashboard Cite

“…The state-of-the-art in PDE and jitter prediction relies on Monte Carlo simulation which is computationally extremely expensive [9]- [12]. In this paper we introduce an alternative technique, combining the McIntyre model [13] with analytical simulation of the jitter tail [14]. Recent works explored the statistical fluctuation of the avalanche process together with a study on SPAD's time resolution [15], [16].…”

mentioning

confidence: 99%

Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices

Helleboid

Rideau

Grebot

et al. 2022

IEEE J. Electron Devices Soc.

Self Cite

View full text Add to dashboard Cite

A new method to reliably simulate the PDE and jitter tail for realistic three-dimensional SPAD devices is presented. The simulation method is based on the use of electric field lines to mimic the carriers' trajectories, and on one-dimensional models for avalanche breakdown probability and charges transport. This approach allows treating a three-dimensional problem as several one-dimensional problems along each field line. The original approach is applied to the McIntyre model for avalanche breakdown probability to calculate PDE, but also for jitter prediction using a dedicated advection-diffusion model. The results obtained numerically are compared with an extensive series of measurements and show a good agreement on a wide variety of device designs.Index Terms-avalanche breakdown probability, breakdown voltage, jitter, photon detection efficiency (PDE), single-photon avalanche diode (SPAD), Technology computer-aided design (TCAD) I. INTRODUCTION AND DEVICE STRUCTURESS INGLE-Photon Avalanche Diodes (SPAD) are key optoelectronic detectors for medical imaging, camera ranging, and automotive laser imaging detection and ranging (LiDAR) applications. Currently, the device leading the market of SPADs is a micrometric silicon (Si) PN junction associated with nearby CMOS electronics biasing the system above the breakdown voltage (BV) [1].The main figure of merit for the sensor sensitivity is the photon detection efficiency (PDE), which is the probability that a photon hitting the SPAD is detected. It can be evaluated by multiplying the probability that an incoming photon hits the photosensitive area of the sensor, the fill factor (FF), by the probability that the photon is absorbed within the Manuscript submitted the February 8th 2022. The authors gratefully acknowledge VIZTA project (https://www.vizta-ecsel.eu/) for

show abstract

Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices

Cited by 4 publications

References 9 publications

Multiscale SPAD modeling: from Monte Carlo to SPICE simulations

Multiscale SPAD modeling: from Monte Carlo to SPICE simulations

Modeling of SPAD avalanche breakdown probability and jitter tail with field lines

Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices

Contact Info

Product

Resources

About