“…With the development of the gene chip and NGS technology, getting SNP quickly becomes feasible and provides an effective way to identifying genes/QTLs for complex traits (Zhu et al, 2008;Liu et al, 2017;Wang et al, 2020). Now, the 55, 90, and 660K wheat SNP arrays are gradually replacing SSR and DArT markers in genetic analysis and have been widely used in the genetic analysis for yield (Gao et al, 2015;Sun et al, 2017;Beyer et al, 2019;Li et al, 2019), disease resistance (stripe rust, leaf rust, or powdery mildew), end-use quality, procession quality, and biotic or abiotic stress tolerance (drought or flood)-related traits (Liu et al, 2016a;Liu et al, 2017;Valluru et al, 2017;Liu et al, 2019;Li et al, 2021;Quan et al, 2021). Linkage analysis and association mapping are the two main ways to uncover the genetic mechanism of complex traits (Zhu et al, 2008;Liu et al, 2016b;Liu et al, 2017).…”