Comprehensive dielectric performance of bismuth acceptor doped BaTiO3 based nanocrystal thin film capacitors

Effects of Bi2O3 additive on sintering process and dielectric, ferroelectric, and piezoelectric properties of (Ba0.85Ca0.15)(Zr0.1Ti0.9)O3 lead-free piezoceramics

“…= 12), which was not observed in our work. Peak shifts to lower 2 angles were previously reported for thin films of nanocrystalline acceptor-doped BT [29] and bulk ceramic samples of (Ba 1−3x/2 Bi x )(Zr y Ti 1−y )O 3 with 0.1 ≤ x ≤ 0.025 [30]. Mahajan et al observed a right-side shift in XRD patterns of Ba 1−x Bi x (Zr 0.05 Ti 0.95 )O 3 ceramics with x ≤ 0.04, but higher amounts of Bi 2 O 3 shifted the XRD peaks to lower angles [31].…”

Self-limiting atomic layer deposition of barium oxide and barium titanate thin films using a novel pyrrole based precursor

“…These electroceramics exhibit high dielectric constants (BaTiO 3 1,2 and BaSrTiO 3 3 ), high proton conductivity (Y doped BaZrO 3 4,5 ) and, depending on the crystal arrangement, ferroelectricity, 5 piezoelectricity 6 and photorefractive effects. 6 These structures can be applied to low temperature superconductors, 7,8 solar cells, 9,10 high-k capacitors 11 and fuel cells. 4 Atomic level control of the films' thickness, composition and crystal structure can be significant for device miniaturization and for verifying theoretically predicted properties in the ultrathin film regime.…”

Structure and performance of dielectric films based on self-assembled nanocrystals with a high dielectric constant

“…It indicates that the BST nanocrystal thin film becomes smoother, showing a reduced surface roughness after FA treatment. When compared to physical deposition of polymers on top of a nanocrystal thin film, such as the deposition of PVP [35] or the evaporation of parylene C [27,45] (see supporting information figure S5 available at stacks.iop.org/Nano/24/415602/mmedia), the polymerized FA (PFA) resides primarily within the intercrystal space of a closely packed nanocrystal thin film. It can be shown that no additional top layer is formed, confirming that a 0-3 nanocomposite is produced as opposed to a layered 2-2 nanocomposite structure.…”

“…The frequency dependence of the capacitance, dielectric loss and ESR were measured using an Agilent 4294A Precision Impedance Analyzer. A comprehensive description of the dielectric performance measurement is given in [35].…”

“…Materials selection indicates the use of a material with a high dielectric constant, such as BaTiO 3 or (Ba, Sr)TiO 3 . The approach is an alternative to other forms of thin film fabrication procedures such as pulsed laser deposition, metalorganic chemical vapor deposition (MOCVD), sputtering or conventional sol-gel processing that still may exhibit their own limitations, such as high temperature processing steps necessary for product crystallization (>500 • C) and/or ultrahigh vacuum (UHV) instrumentation [30][31][32][33][34][35].…”