“…CFE‐SEM‐EDX can be used to analyse the composition and microstructure (Borgers et al, 2020; Gál et al, 2018), and surface finish of ceramic fragments (Ionescu et al, 2015; Ionescu & Hoeck, 2020). Small chips of 28 samples (AG1, AG2, AG3, AG5, AG6, AG9, AG10, AG11, AG13, LA15, AG22, AG23, LA25, AG27, AG28, AG29, AG30, AG31, AG32, AG33, LA36, LA38, LA39, LA40, LA41, AG45, LA47, LA48) were investigated with a Hitachi 8,230 microscope at the National Institute for Research and Development of Isotopic and Molecular Technologies, Cluj‐Napoca, working at 30 kV acceleration voltage, 50 s live time and a <10 nm electron beam.…”