2010
DOI: 10.1016/j.tsf.2009.10.087
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Composition redistribution of self-assembled Ge islands on Si (001) during annealing

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Cited by 9 publications
(8 citation statements)
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“…1(c). This crescent shaped Ge-core has been observed experimentally by Lee et al 36 Experimentally, the Si-capping layer is used not only to prevent Ge atoms from being oxidized during the control oxide growth, 8 but also to preserve the dome shape and size during growth. 60,61 Prior experimental studies of Ge-Si heterostructures demonstrated sharp interfaces with minimal intermixing.…”
Section: Introductionsupporting
confidence: 58%
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“…1(c). This crescent shaped Ge-core has been observed experimentally by Lee et al 36 Experimentally, the Si-capping layer is used not only to prevent Ge atoms from being oxidized during the control oxide growth, 8 but also to preserve the dome shape and size during growth. 60,61 Prior experimental studies of Ge-Si heterostructures demonstrated sharp interfaces with minimal intermixing.…”
Section: Introductionsupporting
confidence: 58%
“…[29][30][31][32][33] Researchers have recently been successful in fabricating high quality Ge-Si NCs of different lateral dimensions and shapes in both single and multiple layers. 19,[34][35][36][37] Of the various experimentally observed NC shapes, hut-shaped and dome-shaped Ge-Si NCs have unique electronic and optical properties. 38 Dome-shaped Ge-Si NCs with the curved bounding facets can relieve strain more efficiently compared to the hut, pyramid, or ring shaped NCs.…”
Section: Introductionmentioning
confidence: 99%
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“…18,19 A further increase in the QD volume even results in the appearance of dislocated superdomes as a result of strain relaxation by dislocation injection. Also during the growth of thin-lm-like SK QD materials, too thin a Si spacer or excessive Ge deposition is prone to Ge QDs coarsening and defect generation, 20,21 thus deteriorating the TE performance. Another challenge on TE materials is accurate tailoring of TE properties of thin-lm-like QD materials with high spatial resolution which is crucial for thermal management of nanoelectronics, or for nanoscale energy conversion.…”
Section: Introductionmentioning
confidence: 99%
“…[13][14][15] Many different isocompositional profiles have been discovered and explained by different island-formation mechanisms. [16][17][18] In this work, utilizing this technique, we observed that the etched Ge/Si/Ge islands exhibited pyramid structures, which differed from the ring-like isocompositional profiles observed in conventional Ge islands. We attempt to elucidate the possible islandformation mechanism on the basis of low surface diffusivity and strain adjustment of the thin Si layer in composite islands.…”
mentioning
confidence: 79%