Composition of native oxides and etched surfaces on Hg1−xCdxTe

Rhiger, David R.; Kvaas, Robert E.

doi:10.1116/1.571705

Cited by 57 publications

(24 citation statements)

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“…thought to result in the formation of a high resistivity coating of CdTeO, according to phase diagram predictions. 22 Our study indicates that the peroxide treatment did not significantly change the Cd:Te composition of the CdZnTe surface and this observation is consistent with but not conclusive that a CdTeO phase has formed on the CZT surface. The STEM-EDS analyses (see Fig.…”

Section: Wsrc-sti-2008-0351supporting

confidence: 76%

Characterization of detector grade CdZnTe material from Redlen Technologies

et al. 2008

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CdZnTe (or CZT) crystals can be used in a variety of detector-type applications. This large band gap material shows great promise for use as a gamma radiation spectrometer. Historically, the performance of CZT has typically been adversely affected by point defects, structural and compositional heterogeneities within the crystals, such as twinning, pipes, grain boundaries (polycrystallinity) and secondary phases (SP). The synthesis of CZT material has improved greatly with the primary performance limitation being attributed to mainly SP. In this presentation, we describe the extensive characterization of detector grade material that has been treated with post growth annealing to remove the SPs. Some of the analytical methods used in this study included polarized, cross polarized and transmission IR imaging, I-V curves measurements, synchrotron X-ray topography and electron microscopy.

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Section: Wsrc-sti-2008-0351supporting

confidence: 76%

Characterization of detector grade CdZnTe material from Redlen Technologies

et al. 2008

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“…While anodic oxides of HgCdTe were commonly found to contain Cd, its prevalence in native oxides has not been widely reported. 2,5,12 We also detected a small shift to lower energy for the Cd3d peak after air exposure. The direction of the peak shift suggests the formation of CdO rather than the more commonly reported CdTeO 3 .…”

Section: Resultsmentioning

confidence: 72%

“…The compositions of native, anodic, chemical and photochemical oxides, as well as their generation techniques, have all been the subjects of investigation. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] A variety of sample preparations were also examined. Treatments with Br-based etches [2][3][4][5][6]8,10,11,[14][15][16] acids 3,9,16 and ion bombardment 1,3,15 are but a few of the simpler examples of the techniques used.…”

Section: Introductionmentioning

confidence: 99%

Investigation of HgCdTe surface films and their removal

Varesi

Benson

Jaime-Vasquez

et al. 2006

Journal of Elec Materi

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We have examined the formation and removal of native surface films on Hg 1-x Cd x Te (n-type, x 5 0.2). Samples were etched with a Br-based solution and then characterized by spectroscopic ellipsometry and X-ray photoelectron spectroscopy. A second set of measurements was acquired after these samples were exposed to air. The results confirm the formation of a surface layer consisting primarily of oxide(s) following an etch of the samples. It also appears that elemental Te may be a component of the postetch film. We presently believe that the predominant components of the oxide are TeO 2 and CdO. Following the formation of the native oxide we examined its solubility by immersing the samples in several common liquids. While isopropanol and acetone had little effect, de-ionized water, methanol and ethylene glycol each removed significant portions of the HgCdTe surface oxide. Atomic force microscope images suggest that the removal of the surface film may not be entirely uniform. Additionally, it was shown that storage in de-ionized water, methanol, or isopropanol essentially preserves the postetch surface properties.

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“…CZT surface passivation was achieved after an oxidation treatment in an aqueous H 2 O 2 solution [4] or by an atomic oxygen bombardment [23]. Based on the equilibrium phase diagram of the Cd-Te-O system, a high resistivity layer of CdTeO 3 was proposed [24] as the probable stable phase formed during the oxidation of CZT surfaces. The hydrogen peroxide (H 2 O 2 ) solution forms an oxide layer with a thickness in the range of 21-44 nm, and a saturation stage was reached after 5 minutes etching [22].…”

Section: Passivation Of Czt Surfacesmentioning

confidence: 99%

Purification, Growth, Fabrication and Characterization of Wide Bandgap Materials for Gamma-Ray Detectors

Bürger¹

1999

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Composition of native oxides and etched surfaces on Hg_1−xCd_xTe

Cited by 57 publications

References 0 publications

Characterization of detector grade CdZnTe material from Redlen Technologies

Characterization of detector grade CdZnTe material from Redlen Technologies

Investigation of HgCdTe surface films and their removal

Purification, Growth, Fabrication and Characterization of Wide Bandgap Materials for Gamma-Ray Detectors

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