2016
DOI: 10.7567/apex.9.061102
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Composition determination of β-(AlxGa1− x)2O3 layers coherently grown on (010) β-Ga2O3 substrates by high-resolution X-ray diffraction

Abstract: We demonstrate X-ray-diffraction-based composition estimation of β-(Al x Ga1− x )2O3 coherently grown on (010) β-Ga2O3. The relation between the strain along the [010] direction and the Al composition of the β-(Al x Ga1− x )2O3 layer was formulated using the stress–strain relationship in the monoclinic system. This form… Show more

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Cited by 100 publications
(72 citation statements)
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“…We note that this orientation has been already discussed in Ref. . One in‐plane direction is the x ‐direction and εxx=aSaF1 .…”
Section: Biaxial Strainsupporting
confidence: 59%
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“…We note that this orientation has been already discussed in Ref. . One in‐plane direction is the x ‐direction and εxx=aSaF1 .…”
Section: Biaxial Strainsupporting
confidence: 59%
“…Previously, the general problem has been treated but evaluated only for simple interface directions. We note that (100) β’(InxGa1x) 2 O 3 /Ga 2 O 3 and (010) β’(AlxGa1x) 2 O 3 /Ga 2 O 3 heterostructures have already been experimentally realized. The symbolic and numerical calculations of this work have been made with Mathematica .…”
Section: Introductionmentioning
confidence: 77%
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“…Компоненты данного тензора не сильно отличаются от результатов расчета в рам-ках приближения локальной плотности с использова-нием присоединенных плоских волн [21]. Вычисление матрицы, обратной к (2), дает коэффициенты тензора податливости, выраженные в GPa …”
Section: квантово-химическое моделирование упругопластических свойствunclassified