Composition dependence of structural and optical properties of Cd1−Zn Te thick films obtained by the close-spaced sublimation

Kosyak, V.; Znamenshchykov, Yaroslav Volodymyrovych; Čerškus, Aurimas; Gnatenko, Yu. P.; Grase, Līga; Vecstaudža, Jana; Medvids, Arthur; Opanasyuk, A. S.; Mežinskis, Gundars

doi:10.1016/j.jallcom.2016.05.065

Cited by 22 publications

(15 citation statements)

References 74 publications

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“…The strong A 1 (Te) and E T O (Te) modes were observed in the spectrum of CZT5 sample. The appearance of Te-related modes could be caused by local overheating of the surface due to using of green excitation with high energy and, therefore, Te-enrichment of the surface [12,33,34]. However, peaks of LO 1 (CdTe), TO 1 (CdTe), TO 2 (ZnTe) modes were not observed in the CZT5 sample spectrum, which could be caused by overlapping with an intensive peak of E T O (Te) mode.…”

Section: Resultsmentioning

confidence: 97%

“…In Ref. [12] we determined that application of infrared laser (E = 1.579 eV) is suitable for the Raman spectra measurement of Zn-poor films (x < 0.10). At the same time, application of the red laser (E = 1.958 eV) is more preferable for films with x ranged from 0.10 to 0.60.…”

Section: Resultsmentioning

confidence: 99%

“…Semiconductor IR (λ = 785 nm), red HeNe (λ = 633 nm) and green Ar (λ = 514 nm) lasers were used as an excitation source. Measurement parameters were the same as in previous work [12]. Registration of signal was carried out by CCD camera.…”

Section: Methodsmentioning

confidence: 99%

“…Various techniques are used for deposition of CZT films, such as magnetron sputtering [6], metal-organic chemical vapor deposition [7], electrodeposition [8], molecular-beam epitaxy [9], thermal vacuum evaporation [10], closed-space vacuum sublimation [11]. Closed-space vacuum sublimation (CSVS) is a promising low-cost technique, which allows to obtain high-quality CZT films with controllable Zn concentration [12].…”

Section: Introductionmentioning

confidence: 99%

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Raman Characterisation of Cd_1-xZn_x Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

et al. 2017

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In this work, we studied the Raman spectra of thick polycrystalline Cd1−xZnx Te (CZT) films with x ranged from 0.06 to 0.68. Additionally, the surface morphology and structural properties were studied in order to determine the crystalline quality of the samples. The Raman spectra had a two-mode behavior typical for CZT solid solution and showed CdTe-and ZnTe-like longitudinal and transverse optical modes. The relationship between the frequencies of CdTe-and ZnTe-related modes on x was studied. We observed the deviation of the compositional dependence of phonon mode frequencies for polycrystalline CZT films in comparison with a similar dependence for CZT single crystals. Such deviation was caused by the effect of structural defects in polycrystalline films on frequencies of vibrational modes. The values of excitation wavelength, which allow achieving of high signal-to-noise ratio on the Raman spectra of CZT films with different zinc concentration in the result of resonant enhancement of phonon modes intensities, were experimentally determined.

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Section: Resultsmentioning

confidence: 97%

Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Raman Characterisation of Cd_1-xZn_x Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

et al. 2017

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“…The appealing advantage of CZT compound is the variation of band gap by changing the zinc concentration. The optimal CZT solid solution with E g ~1.7 eV can be obtained at the chemical composition of x ~ 0.2 [7]. To achieve the best working characteristics of devices, ZnO, CZTS, and CZT films must have the single-phase structure with large coherent domain sizes (CDS) L, low levels of microdeformations ε, microstresses σ, dislocation concentrations ρ, and well-controlled elemental composition.…”

Section: Introductionmentioning

confidence: 99%

Nanostructured ZnO, Cu2ZnSnS4, Cd1−xZnxTe Thin Films Obtained by Spray Pyrolysis Method

Dobrozhan¹,

Kurbatov²,

Danilchenko³

et al. 2018

Semiconductors - Growth and Characterization

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The paper presents the investigation on the influence of substrate temperature T s and the sprayed initial solution volume V s on structural, substructural, optical properties, and elemental composition of ZnO and Cu 2 ZnSnS 4 (CZTS) films as well as state-of-the-art of studying the Cd 1−x Zn x Te (CZT) films obtained by spray pyrolysis technique. The singlephase nanocrystalline ZnO films with average crystallite size of D C = 25-270 nm and thickness of d = 0.8-1.2 μm can be deposited at substrate temperatures of T s > 473 K. The continuous CZTS films with optimal thickness (d = 1.3 μm) for application as absorber layers in solar cells were deposited at the sprayed initial precursor volume of V s = 5 ml. The increase of the substrate temperature up to 673 K caused the significant improvements in the stoichiometry of ZnO films. The optimal stoichiometry ratio of CZTS films for application in solar cells was obtained at V s = 3-4 ml. Optical study of ZnO films showed that these films have a high-transmission coefficient values of T = 60-80%. To the best of our knowledge, there is the lack of works devoted to the study of CZT films obtained by spray pyrolysis technique.

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Combinatorial study of the structural, optical, and electrical properties of low temperature deposited Cd1-Zn Te (0 ≤ x ≤ 1) thin films by MOCVD

Kartopu¹,

Fan²,

Oklobia³

et al. 2021

Applied Surface Science

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Composition dependence of structural and optical properties of Cd1−Zn Te thick films obtained by the close-spaced sublimation

Cited by 22 publications

References 74 publications

Raman Characterisation of Cd_1-xZn_x Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

Raman Characterisation of Cd_1-xZn_x Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

Nanostructured ZnO, Cu2ZnSnS4, Cd1−xZnxTe Thin Films Obtained by Spray Pyrolysis Method

Combinatorial study of the structural, optical, and electrical properties of low temperature deposited Cd1-Zn Te (0 ≤ x ≤ 1) thin films by MOCVD

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Composition dependence of structural and optical properties of Cd1−Zn Te thick films obtained by the close-spaced sublimation

Cited by 22 publications

References 74 publications

Raman Characterisation of Cd1-xZnx Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

Raman Characterisation of Cd1-xZnx Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

Nanostructured ZnO, Cu2ZnSnS4, Cd1−xZnxTe Thin Films Obtained by Spray Pyrolysis Method

Combinatorial study of the structural, optical, and electrical properties of low temperature deposited Cd1-Zn Te (0 ≤ x ≤ 1) thin films by MOCVD

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Product

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About

Raman Characterisation of Cd_1-xZn_x Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

Raman Characterisation of Cd_1-xZn_x Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation