2010
DOI: 10.1063/1.3442512
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Complex permittivity measurements using cavity perturbation technique with substrate integrated waveguide cavities

Abstract: Cavity perturbation technique is widely used in the measurements of complex dielectric permittivity of materials due to its accuracy and ease of configuration. This paper presents the theoretical formulas for the evaluation of complex permittivity of materials using cavity perturbation technique with substrate integrated cavity resonators. With the proposed formulas, the use of various planar cavities is possible by taking into account the dielectric characteristics of the substrate in which the cavity is impl… Show more

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Cited by 59 publications
(31 citation statements)
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“…1, since they have high Q, are highly sensitive to material properties and have minimum radiation effect. This technology has been reported in the past for measuring complex permittivity of dielectric materials [4], [5]. The resonant frequency of these resonators for TE 102 or TE 103 modes of operation is determined by the dimensions of the SIW.…”
Section: B Siw Cavity Resonatormentioning
confidence: 99%
“…1, since they have high Q, are highly sensitive to material properties and have minimum radiation effect. This technology has been reported in the past for measuring complex permittivity of dielectric materials [4], [5]. The resonant frequency of these resonators for TE 102 or TE 103 modes of operation is determined by the dimensions of the SIW.…”
Section: B Siw Cavity Resonatormentioning
confidence: 99%
“…The resonant type sensors are frequently used to measure the complex permittivity and permeability of materials due to their high accuracy and sensitivity. The resonant sensors based on planar technology are preferred in comparison to the conventional waveguide based cavity technique due to their adaptability, low cost, and easy integration with other components [1]- [6]. The planar resonant sensor based on the surface integrated waveguide (SIW) technology appears to be a viable option, which has been explored by few research groups [1], [2], [6].…”
Section: Introductionmentioning
confidence: 99%
“…The resonant sensors based on planar technology are preferred in comparison to the conventional waveguide based cavity technique due to their adaptability, low cost, and easy integration with other components [1]- [6]. The planar resonant sensor based on the surface integrated waveguide (SIW) technology appears to be a viable option, which has been explored by few research groups [1], [2], [6]. The main problem associated with such a type of sensors is the low intensity and sinusoidal varying electric field, which is getting perturbed by the finite volume of the sample [14]- [17].…”
Section: Introductionmentioning
confidence: 99%
“…Several applications, including medical, pharmaceutical, industrial, food, and hydrological, among others, are interested in using microwaves for the measurement of the properties of materials due to the use of low-profile sensors, low power-consumption devices, accuracy in the analysis methods, and realtime testing [1]- [7]. Most of the microwave sensors have been designed for the measurement of complex dielectric permittivity of materials as it offers information of the sample-under-test (SUT) properties, such as moisture contents, microwave absorption, density, temperature, among others [1]- [6]. The most used method for dielectric characterization of materials is based on resonant techniques, due to its high accuracy and high sensitivity [5], [6].…”
Section: Introductionmentioning
confidence: 99%