2007
DOI: 10.1109/tmtt.2007.906498
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Complete Stability Analysis of Multifunction MMIC Circuits

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Cited by 24 publications
(19 citation statements)
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“…The largest Lyapunov exponent of (a) is +0.00937, which means the system is unstable. The Lyapunov exponent of the tested voltage at point (2), shown in Fig. 2(b), is +0.0087, which also indicates the system is unstable.…”
Section: A Floating Negative Capacitor To Match Monopolementioning
confidence: 99%
See 1 more Smart Citation
“…The largest Lyapunov exponent of (a) is +0.00937, which means the system is unstable. The Lyapunov exponent of the tested voltage at point (2), shown in Fig. 2(b), is +0.0087, which also indicates the system is unstable.…”
Section: A Floating Negative Capacitor To Match Monopolementioning
confidence: 99%
“…Since this analysis shows unstable behavior, a stablization network should be added within the loop of the NFC. After adding such a stablization network [9], the system was tested again at points (1) and (2), and the resulting signals can be seen in Fig. 3.…”
Section: A Floating Negative Capacitor To Match Monopolementioning
confidence: 99%
“…A complete but complex analysis procedure for such a circuit is presented in Ref. [20]. A more limited but easierto-implement procedure is proposed and discussed here: starting from the unconditional stability criteria for two ports and assuming a fixed load termination in a third port, formulation by Ref.…”
Section: B Nonlinear Extension Under Large-signal Pumpingmentioning
confidence: 99%
“…The choice of the sensitive node requires some designer expertise because poles of the transfer function are supposed to be the same in any node, but pole-zero cancellation may happen in some nodes, masking unstable poles [20]. Terminals of active devices are usually the most suitable choice, and the repetition of the analysis from different nodes is advisable.…”
Section: Conversion Matrix-based Pole-zero Identificationmentioning
confidence: 99%
“…Next, it is also critical to perform nonlinear parametric and odd stability studies under high power excitation. The strategy adopted for this analysis is based on pole-zero identification of the frequency response obtained at critical nodes of the final circuit (Barquinero et al, 2007). Finally, to avoid irreversible device degradation, thermal simulations are required to accurately predict the highest channel temperature and thermal coupling between transistors.…”
Section: Introductionmentioning
confidence: 99%